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Oxford Instruments provides complementary characterisation technologies to help you gain a deeper understanding of your materials from multiple perspectives.
Contact our local team to discuss your research needs and discover the right solutions to accelerate your research.
We provide solutions from routine EDS microanalysis that demands high-through-put capabilities to the most advanced NanoAnalysis where performance counts.
Powered by Ultim Max Infinity SDD detectors that unlock the infinite potential of EDS - including the world's largest area SDD at 170 mm2, and guaranteed Carbon resolution of 46eV or better for all sensor sizes.
The Ultim Max ∞ (Infinity) SDD detector unlocks the infinite potential of EDS for characterising materials in the SEM. It combines unparalleled accuracy, sensitivity and speed to power AZtecLive software to solve more complex analysis challenges.
Why Infinity
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Xplore is a high throughput compact EDS detector designed for routine microanalysis in the SEM. It’s innovative design means that it has the quality and accuracy you expect from the class leading Ultim Max Infinity large area detectors, but in a much smaller package.
Reduction in cost and complexity but not at the expense of accuracy, reliability or quality.
Key Features
AZtecLive is the software that when powered by Ultim Max Infinity brings the infinite potential of EDS to life. See how live chemical imaging is a new approach to sample investigation and understand our workflows for qualitative and quantitative analysis as well as X-ray mapping and linescanning.
Discover the tools that can help you use EDS to solve your characterisation challenges in the SEM.
Learn what is now possible with Infinity detectors from Oxford Instruments
Our CMOS range of detectors , including the market-leading Symmetry S3, the C-Nano+ and the C-Swift+, all deliver exceptional performance for every type of EBSD analysis. Benefiting from a unique lens-free fibre optic design, our CMOS detectors combine unparalleled sensitivity with excellent analysis speeds, ensuring optimum data quality from any sample.
The Symmetry S3 is the only genuine all-in-one EBSD detector on the market, and is based on the revolutionary Symmetry detector, the world’s first EBSD detector to utilise advanced CMOS technology.
The C+ series EBSD detectors, the C-Nano+ and the C- Swift+, are 2nd generation entry-level detectors designed for every type of EBSD application.
The C-Nano+ delivers a top acquisition speed exceeding 600 pps with exceptional 311 x 256 pixel resolution patterns: this makes it about 5-6 times faster than comparable CCD-based detectors, , using patterns with at least 4 times as many pixels.
The C-Swift+ uses a customised CMOS sensor coupled with fibre optics, to deliver both speed and sensitivity, ensuring high quality results on even the most challenging materials.
AZtecHKL is a flexible yet intuitive EBSD data acquisition software platform, designed for ease of use and to deliver consistently high-quality results. Based around a series of dedicated navigators and fully integrated with EDS, AZtecHKL makes any type of EBSD or transmission Kikuchi diffraction (TKD) data acquisition a routine task.
AZtecCrystal is a future-proof, innovative EBSD data processing software package that combines a modern interface with a host of high-end functionality. Constantly developing, AZtecCrystal now includes unique tools such as dislocation analysis & parent grain reconstruction, with MapSweeper enabling advanced dataset reanalysis using pattern matching techniques.
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Unity's innovative design incorporates both backscattered electron and X-ray sensors within a single package, strategically positioned directly beneath the pole piece to maximise signal collection while eliminating shadowing effects from unpolished samp les.
Using the latest advancements in Energy Dispersive Spectroscopy (EDS) technology, including ultra-fast electronics and advanced spectrum processing algorithms, the Unity BEX/EDS system sets a new standard for elemental analysis in SEM. With increased sensitivity and speeds up to 100 times faster than conventional systems, Unity enables the analysis of sensitive samples, rough surfaces, and trace elements (>0.1 wt%), all under standard SEM imaging conditions.
BEX is a pioneering analytical technique for SEM. BEX combines Backscattered Electron and X-ray (BEX) imaging in a single technique, simultaneously. In an industry breakthrough, the best of both techniques are integrated to accelerate your time to discovery.
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Discover more about the BEX imaging technique and see how the Unity detector will revolutionise analysis in scanning electron microscopy using a variety of sample types to show the power of this new technology in action
You will learn:
Oxford Instruments' confocal Raman imaging microscopes deliver advanced chemical characterization with industry-leading speed, sensitivity and resolution – simultaneously.
The witec360 microscopes include variations for every budget environment and sample type. Through a modular hardware and software architecture, the systems can be configured for individual requirements and reconfigured as experiments evolve. Excitation wavelengths from the UV through VIS to the NIR are available and their fiber-based beam delivery provides a flexible laboratory footprint.
The witec360 sets the highest standards for performance in confocal Raman imaging. Every component is optimised for maximum transmission efficiency and consistency, enabling accurate results within seconds. This accelerates your imaging workflows and facilitates even the most challenging applications.
Why witec360
World's first fully integrated Raman Imaging and Scanning Electron Microscopes
RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.
alphaCART is Oxford Instruments' mobile, confocal Raman system for all applications that require bringing the lab to the sample.
The system's high confocality and signal sensitivity also allow measurements through protective glass and windows, which enables studies of gases or chemical processes inside reaction chambers and other enclosures. Researchers working in the arts and archaeology, geo- or materials science will especially benefit from this versatile and powerful analytical tool.
Benefits
Oxford Instruments Asylum Research AFMs are widely used by both academic and industrial researchers for characterizing samples from diverse fields spanning material science, polymers, thin films, energy research, and biophysics.
In addition to routine imaging of sample topography and roughness, Asylum Research AFMs also offer unmatched resolution and quantitative measurement capability for nanoelectrical, nanomechanical, and electromechanical characterization.
Recent advances have made these measurements far simpler and more automated for increased consistency and productivity. Its Cypher, MFP-3D, Jupiter, and Vero AFM product lines span a wide range of performance, versatility, and budgets.
Meet our next-generation AFMs that precisely and accurately measures true tip displacement using Quadrature Phase Differential Interferometry (QPDI). Built on the unrivaled stability and performance of the Cypher AFM family, this unique patented QPDI innovation enables Vero AFMs to provide results with higher accuracy, precision, and repeatability.
Quadrature Phase Differential Interferometry:
Large-Sample AFM with Superior Resolution, Speed, Ease of Use, and Flexibility – capable for samples up to 210 mm diameter.
Proven AFMs engineered for exceptional resolution, speed, and versatility
The Cypher Family delivers industry-leading AFM performance built on an ultra‑stable, low‑noise platform - enabling fast & high‑resolution imaging and broad research versatility across materials science and life science disciplines.
Accuracy, Speed, Operando Testing
FemtoTools, now proudly part of Oxford Instruments, continues to lead in ultra-precise mechanical testing solutions. With a legacy of Swiss engineering excellence, our cutting-edge technologies empower researchers, engineers, and manufacturers to measure the smallest forces with unmatched accuracy. As part of a global scientific instrumentation leader, we’re bringing our innovations to more markets and accelerating the future of micro- and nanomechanical testing.
Ultra-fast nanoindentation in operando conditions
The iX05 nanoindenter is a standalone MEMS-based nanoindenter optimized for material property analysis in a wide range of operando conditions such as at high-temperature, at low-temperature, at high strain rates.
Why iX05?
Operando Nanoindentation
Ultra-Fast Nanoindentation
Ultra-High Resolution
Ultra-high resolution nanoindentation with unmatched repeatability to detect even the smallest variations in hardness and modulus
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In-situ FIB/SEM nanoindenter for compression, tensile and fracture testing of micro- and nanoscale samples with simultaneous high resolution imaging of the tested sample using SEM.
Why NMT04?
Standalone nanoindenter for high resolution high-speed measurement of local mechanical properties of materials in air, liquid or inert gas environment
Why iO4?
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