AZtec for EDS, EBSD, BEX and RISE

  

 

AZtec
for EDS, EBSD, BEX and RISE

AZtec is a comprehensive software platform for electron microscope analysis, delivering fast and accurate X-ray microanalysis with powerful characterisation tools. Supporting EDS, EBSD, BEX, and correlative workflows, it enables confident, efficient analysis across a wide range of materials applications.

Discover the latest updates to the AZtec software platform, introducing new capabilities and enhanced workflows for faster, more powerful materials characterisation.

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AZtec - Free Upgrade to the latest version

For the first time, AZtec users will have the opportunity to upgrade their software free of charge. Upgrade today to access the latest AZtec features and performance enhancements. Maximise the capabilities of your EDS, EBSD, BEX, and RISE workflows.

New functionality in this release includes:

AZtecRISE Navigator: RISE-focused workflow within Aztec. Raman Data Impor enables storage of Raman images from Control software directly within AZtec projects.

Magic Wand selection for Cartography Mode: This new feature enables users to easily select an irregular region for a cartography run, with a single click.

Batch Export & HTML Report: The functionality designed for those users who want a quick export of all EDS data in a project

New AutoPhaseMap: A new way of automatically identifying phases from X-ray map data and generating clear, easy-to-interpret phase distribution maps.

AutoPhaseMap

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AZtecHKL - EBSD Acquisition Tool enhanced with Human Expertise and Artificial Intelligence

An advanced software platform for EBSD analysis and crystallographic characterisation in the electron microscope. Delivering real-time acquisition, rapid analysis, and seamless integration with EDS, it provides the speed, accuracy, and flexibility required for both routine and advanced materials research.

EBSD Shadow Masking: uses AI to remove dynamic EBSP shadows that interfere with EBSD band detection. Particularly valuable for fracture surface investigation, failure analysis, and focused ion beam trench analysis.

EBSD Shadow Masking

Tailored Workflow: A licensed solution that uses Oxford Instruments’ EBSD expertise to fine-tune acquisition parameters for your system and samples, with a custom step-by-step navigator for faster setup and robust, standardised workflows.

Intelligent EBSD Acquisition Tool: AutoCal works seamlessly and automatically to calculate calibration parameters based upon changes in geometry.

AutoLock, an integrated drift correction tool that corrects EBSD and EDS data simultaneously, resulting in the most accurate maps.

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Discover More with our Product Range

Ultim Max Infinity

Ultim Max Infinity

Ultim Max Infinity SDD detectors unlock the infinite potential of EDS - including the world's largest area SDD at 170 mm2, and guaranteed Carbon resolution of 46eV or better for all sensor sizes.

CMOS EBSD Detectors

CMOS EBSD Detectors

Our CMOS range of detectors all deliver exceptional performance for every type of EBSD analysis. They combine unparalleled sensitivity with excellent analysis speeds, ensuring optimum data quality from any sample and condition.

Raman-SEM Microscopes

Raman-SEM Microscopes

RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.

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