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Dec
1
2026 MRS Fall Meeting & Exhibit

Join us at the 2026 MRS Fall Meeting, taking place from December 1-December 3, 2026, in Boston, Massachusetts. ​

We are excited to invite you to our booth #608, where we will have the opportunity to engage with you and discuss your current work and workflows.​

At our booth, we will be showcasing our cutting-edge technologies, including our nanoindentation technology, AFM, confocal Raman microscopy, and electron microscopy detectors. Additionally, we will be unveiling exciting developments that are currently in the pipeline and offering live demonstrations of our latest innovations.​

We will have a Vero S AFM available in our booth for personalized demos. To secure your spot, please register using the form below.​

We encourage you to stop by our booth to explore the possibilities and discover how our advanced solutions can enhance your research and applications. We look forward to meeting you and discussing how Oxford Instrument scan contribute to your success at the 2026 MRS Fall Meeting.

Location

Boston, MA | USA

Booth Number

608

Date

December 1 - December 3

Businesses

Asylum Research, NanoAnalysis, Raman

Book a Demo

Oxford Instruments will be showcasing our cutting-edge technologies. This includes our nanoindentation technology, Atomic Force Microscopy (AFM), confocal Raman microscopy, and electron microscopy detectors. We are proud to unveil exciting developments that are currently in the pipeline and offer live demonstrations of our latest innovations. Visit our booth to experience firsthand the advancements we are making in these fields.

Vero S is the standard ambient configuration of the next-generation Vero AFMs, which precisely and accurately measure true tip displacement using Quadrature Phase Differential Interferometry (QPDI).

Learn more about the Vero S

Ultim® Max ∞ SDD detectors unlock the infinite potential of EDS for characterizing materials in the SEM. They combine unparalleled accuracy, sensitivity and speed to power AZtec Live software to solve the most complex or difficult analysis challenges.

Learn more about Ultim Max Infinity

Join Oxford Instruments for a speaking session at the highly anticipated Material Research Society meeting. Dr. Miriam Boehmler, Head of Raman Applications, will discuss how confocal Raman spectroscopy and imaging enable real-time, in situ analysis of materials under extreme thermal conditions, showcasing applications in diamond coating optimization and refractory material development, and highlighting recent instrumental advancements that expand Raman’s impact on high-temperature material design.

Session: SF09.04 Materials at High Temperatures – Characterization and Testing

Title: In Situ Confocal Raman Spectroscopy and Imaging for High-Temperature Materials Characterization

Speaker: Dr. Miriam Boehmler, Head of Applications

When: 12/5, 11:15 – 11:30 am

Where: Hynes, Level 2, Room 209

Additionally, join us for the Oxford Instruments sponsored poster session covering the latest advances in understanding selective transport in nanomaterial-based pores, channels, and membranes.

Session: NM03 Selective Separations in Nanomaterials

When: 12/2, 7 – 9PM

Where: Hynes, Level 1, Hall A