Nov
29
2026 MRS Fall Meeting & Exhibit

Join us at the 2026 MRS Fall Meeting, taking place from November 29 - December 5, 2026, in Boston, Massachusetts. ​

We are excited to invite you to our booth #608, to explore how our systems can improve your research in quantum materials, 2D materials, structural materials and more.​

At our booth, we will be showcasing our nanoindentation technology, AFM, confocal Raman microscopy, and electron microscopy technologies. Additionally, we will hosting live demonstration of our AFM, Nanoindentation, and Raman systems so you see our tools in action.

We will have a Vero S AFM available in our booth for personalized demos. To secure your spot, please register using the form below.​

We encourage you to stop by our booth to explore the possibilities and discover how our advanced solutions can enhance your research and applications. We look forward to meeting you and discussing how Oxford Instrument scan contribute to your success at the 2026 MRS Fall Meeting.

Location

Boston, MA | USA

Booth Number

608

Date

November 29 - December 5

Businesses

Asylum Research, NanoAnalysis, NanoIndentation, Raman

Book a Demo

Oxford Instruments will be showcasing our cutting-edge technologies. This includes our nanoindentation technology, Atomic Force Microscopy (AFM), confocal Raman microscopy, and electron microscopy detectors. We are proud to unveil exciting developments that are currently in the pipeline and offer live demonstrations of our latest innovations. Visit our booth to experience firsthand the advancements we are making in these fields.

iX05 Operando Nanoindenter

The iX05 is a high-performance operando nanoindenter engineered to measure local mechanical properties under real-world conditions—including high/low temperatures, high strain rates, and liquid environments. Unlike traditional systems limited to lab settings, the iX05 enables testing in environments that reflect actual material applications. Powered by FemtoTools’ MEMS-based technology and fast control electronics, it delivers unmatched resolution, speed, and environmental control for advanced materials research.

Learn more about Nanoindentation

witec360 Raman Microscope

The Oxford Instruments witec360 is the new benchmark for Raman imaging and correlative microscopy systems, designed to meet the growing demands of academic and industrial researchers for comprehensive analysis at the nanoscale.

Learn more about the witec360

Ultim® Max ∞ SDD detectors unlock the infinite potential of EDS for characterizing materials in the SEM. They combine unparalleled accuracy, sensitivity and speed to power AZtec Live software to solve the most complex or difficult analysis challenges.

Learn more about Ultim Max Infinity

Symmetry S4

For years, real-time pattern matching has been viewed as the next advancement in microscopy analysis. With Symmetry S4, that capability is now available directly within your workflow.

Symmetry S4 identifies and matches diffraction patterns in real time, enabling immediate feedback as data is acquired. By combining automated pattern recognition with on-the-fly analysis, researchers can make informed decisions faster and gain deeper insight during every experiment.

More than a new software capability, Symmetry S4 represents a new approach to microscopy, moving beyond data collection to real-time interpretation and discovery.

Learn more about Symmetry S4

Coming soon