Workshop: Next-generation advancements in Atomic Force Microscopy

From redefining precision and accuracy with interferometric detection to video-rate imaging

Wiesbaden, 18-19 June 2024

Oxford Instruments is excited to announce a new workshop on Atomic Force Microscopy taking place from 18 to 19 June in our laboratory in Wiesbaden, Germany. The workshop will focus on recent groundbreaking advances in Atomic Force Microscopy (AFM).

During this 2-day workshop, we will introduce Vero, the next-generation AFM that precisely and accurately measures true tip displacement using Quadrature Phase Differential Interferometry (QPDI). Interferometric AFM marks the next step in the evolution of AFM design providing unprecedented performance without compromise in terms of accuracy, range, and noise.

Through alternating lectures as well as hands-on sessions we will elaborate on the advantages of QPDI for applications such as Force Spectroscopy, Piezoresponse Force Microscopy (PFM), or low-noise imaging for 2D Moiré pattern visualization.

Furthermore, sessions about recent exciting advancements in imaging speeds up to video-rate and high-resolution on large-samples will complete this workshop. 

On the second day, after the official programme concluded, there will be the opportunity for participants to run measurements on personal samples. These limited time slots are available on a first come, first served basis, please indicate your interest during the registration. 

Venue

Oxford Instruments GmbH 

Borsigstraße 15a
65205 Wiesbaden
Germany

Registration

There is no registration fee and we invite all participants to register due to limited seating. Click the "Register Now" button to confirm your attendance.

If you wish to bring your own samples for measurements, please indicate this in the Registration Form.

We are looking forward to meeting you at our workshop and discussing your current work and research with you!