Join us to explore the latest advancements in SEM based microanalysis techniques, including EDS, EBSD, WDS, BEX, and in situ nanoindentation. Cutting-edge analytical solutions unconstrained by conventional limitations can now offer unprecedented accuracy, speed, and sensitivity in microanalysis and this workshop will give attendees an opportunity to learn from subject matter experts about:

• X-ray microanalysis on fracture surfaces
• Quantitative EDS and trace element analysis
• High spatial resolution (sub-10-nm) EDS-EBSD analyses in SEMs
• Correlative SEM-EDS-EBSD-Nanoindentation analysis
• Best practices for EDS and EBSD analyses

Detailed agenda to follow

Parking information:

Visitor parking (payable by credit card) is available at North Annex Lot (9-minute walk) and Founder’s Court Visitor Lot (6-minute walk).