Analytics for Electron Microscopes
Come and see our Electron
Microscopy products, which enable you to accurately analyse and characterise
materials down to the nanoscale level more rapidly.
Earlier this year we celebrated the launch of Oi View. This groundbreaking new
digital platform which delivers real-time insights on your Oxford Instruments SEM
systems to your phone, tablet or PC, allowing you to stay informed, wherever
you are.
Come and experience the new Unity - the world’s first BEX imaging
detector that combines Backscattered Electron and X-ray (BEX) imaging in a single technique,
simultaneously. Supported by our AZtec software platform, our EDS detectors give
you accurate compositional analysis in real time. For
microstructural detail, the Symmetry S3 EBSD detector give unrivalled
acquisition speeds, pattern resolution and sensitivity.
We are running live demos on the booth during the conference of our Unity, Symmetry S3 and Ultim systems from the stand.
Book a demonstration now via the following form.