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Specializing in Material Characterization and Failure Analysis we deliver cutting-edge solutions that empower defense agencies to push the boundaries of innovation.
Our material characterization tools enable engineers to understand the impact of stress, temperature, corrosion while also supporting failure analysis efforts like root cause analysis.
With a proven track record of successful collaborations on federally funded research projects, Oxford Instruments is here to support groundbreaking innovation, mission readiness, and technological superiority.
Have a question?Electron Microscopy solutions provide leading-edge tools that enable materials characterization and sample manipulation at the nanometer scale.
High resolution, MEMS-based nanoindenters for applications in metallurgy, thin films, and microsystems technology.
Application Note: Correlated Mechanical MicroscopyConfocal Raman imaging microscopes for 2D and 3D chemical characterization.
The best atomic force microscopes for academic research and industrial R&D.
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