Advanced techniques in SEM and EDS for biological samples

New Webinar: Advanced techniques in SEM and EDS for biological samples

Energy Dispersive X-ray spectrometry (EDS) measures and maps the distribution of elements within a sample. It can be used as a powerful imaging tool, providing accurate identification of stains, labels, and ultrastructural features. Additionally, EDS can be used to conduct analysis on the relative quantities of a wide range of elements, providing compositional data on native elements and exogenous features. 

This webinar will cover an introduction to biological EDS,  using the Ultim Extreme detector, and how it can be used in combination with standard and advanced scanning electron microscopy  (SEM) techniques. Topics will include volume electron microscopy, STEM in SEM, and combining EDS with stereoscopy for topographical information, supported by examples of these applications in research. We will also feature a demonstration of setting up an EDS experiment in an SEM to look at calcium in osteroblasts.

In this webinar, you will learn how: 

  • Understand the added value of compositional information for the identification and interpretation of cell and tissue ultrastructure
  • Become familiar with the range of techniques that are available with EDS, the type of information that can be obtained about biological samples in general and how EDS can be used to address a range of research questions
  • Recognise the benefits of combining EDS with advanced SEM techniques
Watch on demand now!
On Demand
Time:

On Demand

Duration:

1 hour

Language:

English

Businesses:

NanoAnalysis

Watch on demand

Speakers

Dr Louise Hughes - Oxford Instruments
Business Manager

Dr Louise Hughes is the Business Manager for EBSD, FIB and Life Sciences at Oxford Instruments NanoAnalysis. Prior to this she ...

Scott Dillon - University of Cambridge
Research Associate

Scott is a postdoctoral researcher at the Wellcome-MRC Cambridge Stem Cell Institute studying mammalian digit regeneration. Sco...

Learn more about Oxford Instruments' Ultim Extreme Silicon Drift Detector, a breakthrough solution for ultra high-resolution FEG-SEM applications and delivers solutions beyond conventional micro- and nano-analysis.