30 kV STEM-SEM – Fully utilising the SEM to acquire nanoscale EDS & reduce TEM workload

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A technique that has yet to be widely adopted across the microscopy community, we feel that STEM-SEM provides a strong alternative to traditional TEM and STEM. It has shown to be extremely effective when analysing features with sizes between 3 and 100 nm, whilst requiring significantly less column alignment and faster turnaround when imaging a range of samples. Learn more in this tutorial.

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Time:

On Demand

Duration:

1 Hour

Language:

English

Businesses:

NanoAnalysis

Speaker

Dr Sam Marks - Oxford Instruments
Key Account Manager

Dr Sam Marks graduated with an MPhys in Physics from the University of York, and a PhD in electron microscopy from the Universi...