During the Fourth Wiley Analytical Science Conference, our three speakers will present how the combination of Raman imaging, SEM and EDS provides a more comprehensive understanding of samples, such as batteries, low-dimensional materials and more.
Scanning electron microscopy can be integrated with energy-dispersive X-ray spectroscopy (EDS), Raman imaging, and electron backscatter diffraction (EBSD) in a common vacuum chamber. This complements SEM’s structural acuity with elemental, molecular and crystallographic characterisation techniques, respectively.
Our three presenters will describe the individual methods before showing how their combination provides a more comprehensive understanding of samples. Application examples will focus primarily on battery research, accompanied by investigations of low-dimensional materials, pharmaceutical particles, geoscience specimens and more.
As RISE (Raman Imaging and Scanning Electron) microscopes offer performance and accessibility, this event will appeal to scientists in a wide range of fields.
On Demand
On Demand
Duration:60 min.
Language:English
Businesses:WITec | Raman, NanoAnalysis
Dr. Schmidt studied physics at the Babes Bolyai University in Cluj-Napoca, Romania, and obtained her Ph.D. from the University ...
Alexandra is a geologist by training. She studied at the National and Kapodistrian University of Athens (NKUA) and in Trinity C...
Dr. Leon Hütsch ist ursprünglich Dipl. Ing. 2009 an der TU Hamburg-Harburg.
2014 promovierte er zum Dr.-Ing. am Helmho...
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