This detailed presentation focuses on Raman microscopy combined with other methods, such as AFM, SEM and SHG, for the comprehensive characterization of energy storage devices, semiconductors and 2D materials.
This presentation describes the principles of 3D Raman imaging and the speaker shows in detail how to access chemical imaging at the highest spatial and spectral resolution. Comprehensive analyses of samples often require a combination of different techniques. Structural information on a sample’s surface can be obtained by Atomic Force Microscopy (AFM) or Scanning Electron Microscopy (SEM). Raman imaging can reveal its chemical composition and by combining the techniques, structural and chemical information can be easily acquired from the same sample position. These approaches are described and the power of correlative Raman-AFM and Raman-SEM imaging for analysis is illustrated in the contexts of energy storage devices, semiconductors and 2D materials.
This presentation was recorded as part of a webinar that was originally broadcasted by Physics Today under the same title on May 11, 2021.
c. 50 min.Language:
WITec | Raman
Dr. Schmidt studied physics at the Babes Bolyai University in Cluj-Napoca, Romania, and obtained her Ph.D. from the University ...
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