How to Achieve WDS Data Quality with a Modern EDS Detector

This webinar demonstrates the newfound capabilities of our EDS detectors when tackling applications once reserved for WDS. 

Our SEM-WDS technology offered the highest spectral resolution, lowest detection limits, and was well-accepted as a means of high-quality quantification. However, the growth in capability of EDS detectors has significantly reduced the advantage of a WDS system on the SEM. The applications where SEM-WDS analysis was traditionally the only means of producing reliable data are increasingly minor. 

Considering this, our webinar aims to demonstrate the usability of EDS detectors, supported by Tru-Q IQ spectrum processing, for applications where WDS has traditionally been preferred. 

This includes: 

· Peak overlaps 

· Light element analysis

· Minor and trace element constituents 

· Quantitative analysis

At the same time, we can also leverage the significant improvements in speed, versatility, and ease-of-use gleaned from our most recent EDS technology. 

Watch this webinar if you’re looking for a direct comparison of EDS vs. WDS, or are seeking guidance on how to level up your EDS data to WDS standards

Join us and discover:

• The reasons behind our SEM-WDS discontinuation
• How Ultim Max ¥ EDS and Unity BEX detectors are well equipped to execute traditional WDS applications
• Where Tru-Q IQ spectrum processing is vital for resolving peak overlaps and producing high-quality quantitative analysis
• Practical guidance on achieving WDS data quality with an EDS detector

Register now