Introducing the Future of Atomic Force Microscopy

Register Now

OI Academy | Webinar
Discover the Vero AFM with QPDI Technology

14:00 Taiwan/Singapore | 15:00 Japan/Korea | 16:00 Sydney | 18:00 New Zealand

Experience the next-generation AFM built for ultimate precision, accuracy, and repeatability.

Join us for a special live webinar unveiling the Vero AFM, the latest breakthrough in nanoscale measurement. Built on the trusted Cypher AFM platform, Vero introduces patented Quadrature Phase Differential Interferometry (QPDI) to deliver true tip displacement with unprecedented accuracy.

Whether you're a researcher in nanotechnology, materials science, biology, or semiconductors, a lab manager exploring high-performance instrumentation, or an AFM user seeking greater precision and repeatability—this webinar is designed with you in mind.

What to Expect in This Live Event

  • System Introduction – Understand the engineering behind Vero AFM and its leap beyond conventional AFMs
  • Live Hardware Showcase – See how compact and stable the system really is
  • Demonstration with Real Samples – Watch the Vero AFM in action across multiple applications
  • Expert Q&A – Get your questions answered live by AFM specialists


What You’ll Learn

  • How QPDI technology enables true tip displacement measurements
  • The impact of sub-nanometer accuracy on your imaging and analysis
  • What sets Vero apart in terms of repeatability, speed, and precision
  • How Vero AFM enhances performance over traditional optical beam detection
  • Ways to integrate Vero into your lab for greater workflow efficiency
  • Real-world applications and results from various sample types
Register Now
15 July 2025
Time:

2 : 00 PM (SGT)

Duration:

60 minutes

Language:

English

Businesses:

OI Academy, Asylum Research

Questions for our Expert?

Pre-submit Question Here

Speaker

Dr. Taesung LEE - Oxford Instruments - Asylum Research - Korea
Application Scientist