Products
DEPOSITION TOOLSPlasma Enhanced Chemical Vapour Deposition (PECVD)Inductively Coupled Plasma Chemical Vapour Deposition (ICPCVD)Atomic Layer Deposition (ALD)Ion Beam Deposition (IBD)ETCH TOOLSInductively Coupled Plasma Etching (ICP RIE)Reactive Ion Etching (RIE)Deep Silicon Etching (DSiE)Atomic Layer Etching (ALE)Ion Beam Etching (IBE)
Learning
Figure 1. 2D histograms of indentation property distributions as a function of inter-indentation spacing from the maps acquired over the case-hardened C45 steel in cross-section – illustrating the transitions between mapping resolution and phase resolution. Histogram coloring is on an arbitrary scale, due to varying number densities between scales.
Figure 2. Indentation properties of individual phases extracted from the statistical distributions as a function of indentation depth.