Products
DEPOSITION TOOLSPlasma Enhanced Chemical Vapour Deposition (PECVD)Inductively Coupled Plasma Chemical Vapour Deposition (ICPCVD)Atomic Layer Deposition (ALD)Ion Beam Deposition (IBD)ETCH TOOLSInductively Coupled Plasma Etching (ICP RIE)Reactive Ion Etching (RIE)Deep Silicon Etching (DSiE)Atomic Layer Etching (ALE)Ion Beam Etching (IBE)
Learning
Figure 1. Hardness variation over case-hardened C45 steel in cross-section – Optical micrograph showing the etched microstructure with a high load indentation map and Vickers hardness tests and the corresponding hardness as a function of distance. Values for Vickers and simple indentation converge when testing parameters match.