Discover the latest developments in microscopy and imaging at the 55th annual Texas Society for Microscopy meeting.
Oxford Instruments NanoAnalysis, providers of leading-edge tools for enabling materials characterisation and sample manipulation, will be exhibiting their newest research solutions for SEM-EDS, TEM and EBSD.
Drop by our table to discuss our custom solutions for your research needs. We're looking forward to meeting you at the event and discussing your current work and workflows with you. If you would like to book a meeting with us at the show, please complete the form below.
For further information: Texas Society for Microscopy
College Station, Texas, USA
20 - 22 February