Join us for this in-person workshop on atomic force microscopy (AFM) that will feature Dr. Ted Limpoco from Oxford Instruments Asylum Research. The event will be hosted by Dr. Changhong Cao from the Mechanical Engineering Department at McGill University. Topics will include the principles of AFM and its various applications. Researchers will also present their work in 2D materials and moiré patterns.
Dr. Changhong Cao - Assistant Professor, Dept. of Mechanical Engineering, McGill University
Showcasing previous work on multi-scale mechanical characterizations of ultrathin films using AFM, including AFM indentation for modulus and strength measurement of monolayer graphene and graphene nanocomposites, as well as friction force microscopy for interfacial shear strength characterizations of 2D materials.
Dr. Peter Grutter - James McGill Chair, Professor of Physics, McGill University
Demonstrating how to interpret tapping (AC) operation mode, which is often used to obtain high-quality AFM images. Discussion will touch on the relevant theory behind tapping, as well as the practical aspects of what to look for to facilitate interpretation of the acquired data.