Webinar

AFM for Semiconductor Dielectric
Material Preparation and Characterization

Dec
7
AFM for Semiconductor Dielectric Material Preparation and Characterization

Join us for our webinar on Semiconductor Dielectric Material Preparation and Characterization. You'll hear from Oxford Instruments experts in Atomic Layer Deposition (ALD) and Atomic Force Microscopy (AFM), who will delve into obtaining information about the morphology, mechanical and electrical properties of samples. They will also demonstrate how the addition of nanoTDDB expands the electrical characterization capabilities of Jupiter XR AFM

Register for Upcoming Webinar – All Registrants Will Get Access to Recording


Your Speakers:

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Dr. Marta Kocun - Product Line Manager, Oxford Instruments Asylum Research

Marta has a PhD in Biophysics from University of Goettingen where her studies focused on investigating mechanical properties of membranes using the AFM. She has been with Oxford Instruments Asylum Research for over nine years, working on the development of AFM modes and, more recently, in the Product Marketing role for the Jupiter XR large sample AFM.

    agnieszka-kurek-linkedin-headshot

    Dr Agnieszka Kurek - R&D Deposition Commercial Solutions Team Leader, Oxford Instruments Plasma Technology

    Agnieszka has a PhD in Chemistry from Carleton University where her studies focused on precursor synthesis and process development for Atomic Layer Deposition (ALD). Agnieszka has been with Oxford Instruments Plasma Technology for over six years working on Application-based ALD process development. She is now leads applications engineers over a broad range of plasma deposition technologies including ALD, ICPCVD, PECVD, and Ion beam deposition.

    Location

    Webinar

    Date

    December 7, 2022

    Time

    11:00 AM - 12:00 PM (EST)