Join us for our webinar on Semiconductor Dielectric Material Preparation and Characterization. You'll hear from Oxford Instruments experts in Atomic Layer Deposition (ALD) and Atomic Force Microscopy (AFM), who will delve into obtaining information about the morphology, mechanical and electrical properties of samples. They will also demonstrate how the addition of nanoTDDB expands the electrical characterization capabilities of Jupiter XR AFM.
Dec
7
AFM for Semiconductor Dielectric Material Preparation and Characterization
Your Speakers:
Dr. Marta Kocun - Product Line Manager, Oxford Instruments Asylum Research
Marta has a PhD in Biophysics from University of Goettingen where her studies focused on investigating mechanical properties of membranes using the AFM. She has been with Oxford Instruments Asylum Research for over nine years, working on the development of AFM modes and, more recently, in the Product Marketing role for the Jupiter XR large sample AFM.
Dr Agnieszka Kurek - R&D Deposition Commercial Solutions Team Leader, Oxford Instruments Plasma Technology
Agnieszka has a PhD in Chemistry from Carleton University where her studies focused on precursor synthesis and process development for Atomic Layer Deposition (ALD). Agnieszka has been with Oxford Instruments Plasma Technology for over six years working on Application-based ALD process development. She is now leads applications engineers over a broad range of plasma deposition technologies including ALD, ICPCVD, PECVD, and Ion beam deposition.
Location
Webinar
Date
December 7, 2022
Time
11:00 AM - 12:00 PM (EST)
