Seeing is Achieving Workshop is a dynamic two-day event designed to immerse participants in the latest advancements across novel materials, biomaterials, minerology and geochemistry sciences. Attendees will experience live demonstrations of cutting-edge confocal Raman witec360 Hexalight and Vero S AFM equipment, engage with insightful presentations, and interact with technical experts from these disciplines. The experts will showcase the newest applications, share visionary insights, and discuss solutions for you. This workshop is an unparalleled opportunity to see innovation in action and understand how these advancements can be achieved and applied in various fields. Join us to witness and achieve what is possible with Oxford Instruments!
Speakers and Program:
May 5, 2026
8:30 – 9:00 a.m. Coffee and Registration
9:00 – 9:50 a.m. Wei Liu, Oxford Instruments
Title: witec360 with Hexalight spectrometer - Next level of Spectroscopic Microscopy
9:50 – 10:10 a.m. Kate Kiseeva, American Museum of Natural History
Title: Applying Raman Spectroscopy to inclusions in diamonds
10:10 – 11:00 a.m. Cheryl Yao - Rutgers University
Title: Characterization of Microplastics in Indoor and Ambient Air in Northern New Jersey
11:00 – 11:30 a.m. Coffee Break
11:30 – 12:00 p.m. TBD
Title:
12:00 – 1:00 p.m. Lunch
1:00 – 1:50 p.m. Ted Limpoco, Oxford Instruments
Title: Can AFMs be more accurate and precise? New interferometric detection system for tip displacement sensing
1:50 – 2:10 p.m. Break
2:10 – 3:00 m. St. John Whittaker, NYU
Title: Probing crystalline anisotropy of helicoidal crystals
3:00 – 3:50 p.m. TBD
Title:
3:50 – 4:00 p.m. Closing Remarks
May 6, 2026
9:00 - 10:00 a.m. Demo
10:00 - 11:00 a.m. Demo
11:00 - 12:00 a.m. Demo
1:00 – 2:00 p.m. Demo
2:00 – 3:00 p.m. Demo
3:00 – 4:00 p.m. Demo
Abstracts
Wei Liu
Raman spectroscopy has been widely used in the recent development of semiconductor, energy storage and quantum materials, high speed and high resolution confocal Raman imaging provides extremely valuable material information. Newly launched witec 360 with Hexalight spectrometer brings a few spectroscopic technologies into one integrated solution, including but not limited to Raman, PL and SHG imaging capabilities, which enables a comprehensive, non‑destructive characterization workflow for material studies. In this presentation, system configuration will be introduced and a number of application will be discussed to show case these capabilities.
Cheryl Yao
Airborne microplastics (MPs) are emerging contaminants of concern because of their potential impacts on human health and their contribution to pollution in water, soil, and sediment. This study investigated the distribution, composition, and morphology of airborne microplastics in indoor and ambient air in northern New Jersey, USA. Microplastic fibers, films, and fragments composed of polystyrene (PS), polyethylene terephthalate (PET), polyethylene (PE), polyvinyl chloride (PVC), and polypropylene (PP) were identified in offices, hallways, classrooms, and a single-family house. The deposition rates of synthetic fibers, ranging from 35 µm to 1000 µm in length, were highest in the single-family house and lowest in the classroom, suggesting that residential environments may be important sources of airborne microplastic fibers. In contrast, film-like microplastics with surface areas of 200-5000 µm2 showed the highest deposition rate in the classroom and the lowest in the hallway, likely reflecting intensive use of plastic film materials in classroom settings. The deposition rate of microplastics in ambient air collected on a building roof was only about 2-8% of indoor deposition rates. Microplastics with similar textures but different sizes were identified in both total atmospheric deposition and particulate samples (PM2.5 and PM10), suggesting ongoing fragmentation from microplastics to smaller particles, potentially including nanoplastics. PE particles and fibers dominated indoor air samples, whereas PVC fragments were more prevalent in outdoor ambient air. Overall, these findings provide new insight into the characteristics of airborne microplastics in urban environments and improve our understanding of their sources, transport, fate, and potential health risks.
Ted Limpoco
We have developed the first commercial atomic force microscope to use quadrature phase differential interferometry (QPDI) which greatly improves the accuracy and precision of AFM measurements. This is not the first AFM to use interferometric sensing. Several early implementations were abandoned because of their complexity, limited measurement range, and poor low-frequency noise performance. When optical beam deflection (OBD) was introduced in 1988, it became the standard AFM detection system until today.
St. John
An estimated 1/3 of molecular crystals can be prompted to grow as banded spherulites, which are polycrystalline aggregates of helical fibers. Between glass slides, banded spherulites form as thin films which expose different crystallographic facets at the film-air interface along the fiber helical axis. The crystalline anisotropic properties are therefore patterned, which include refractive index, absorbance, fluorescence, conductivity, and solubility, to name a few. Three separate projects are discussed which revolve around the usage of an Asylum atomic force microscope (AFM) to probe the chiral structures present in banded spherulite films. Because the twisting pitch of the helical crystals is variable and controllable, AFM is well-suited to probe these systems. AFM can map the spatial distribution of properties, ultimately allowing for correlation between crystalline orientation and a corresponding anisotropic property. Three unique applications will be discussed which range from nanoscopic interfacial facet measurements, conductivity measurement in thin films, and a custom photoconductivity module.
Location
Columbia University
Date
May 5-6, 2026
May 5, 2026
500 W 120th St, New York, NY 10027
Seeley W. Mudd Building, Room 524
May 6, 2026
3000 Broadway, New York, NY 10027
Havemeyer Room 544
Businesses
Asylum Research, Raman
Register Here