OI Academy | Workshop
Fundamentals of RISE Microscopy

Discover the power of seamless correlative imaging in this workshop on RISE Microscopy. By combining the ultra-high resolution of Scanning Electron Microscopy (SEM) with the chemical specificity of Raman Imaging, RISE allows you to visualize structural and chemical information from the exact same sample area.

This session will cover the fundamental principles of correlative microscopy, followed by a live demonstration showcasing the integrated workflow.

This exclusive workshop is an opportunity to engage directly with our specialists and see how Oxford Instruments’ RISE solution can support your ongoing projects!

※Admission to this workshop is free but limited seats are available.

View the agenda and submit the registration form below.

Speakers

• Guo Rui, Senior Applications Specialist