Perfecting state-of-the-art in SEM based Microanalysis: Workshop at Rice University

Aug

12

Join us to explore the latest advancements in SEM based microanalysis techniques, including EDS, EBSD, WDS, BEX, and in situ nanoindentation. Cutting-edge analytical solutions unconstrained by conventional limitations can now offer unprecedented accuracy, speed, and sensitivity in microanalysis and this workshop will give attendees an opportunity to learn from subject matter experts about:

X-ray microanalysis on fracture surfaces
Quantitative EDS and trace element analysis
High spatial resolution (sub-10-nm) EDS-EBSD analyses in SEMs
Correlative SEM-EDS-EBSD-Nanoindentation analysis
Best practices for EDS and EBSD analyses

Agenda

8:45–9 a.m.	Introductory Remarks
9–10 a.m.	Correlative SEM-EDS-EBSD-Nanoindentation analysis
10–10:30 a.m.	X-ray microanalysis on unmounted and unpolished samples (rocks, fracture surfaces, powders, and anything you can put in your SEMs)
10:30–11 a.m.	Break
11–12 p.m.	Achieving high throughput, high sensitivity, high accuracy, and high spatial resolution elemental data – What is possible with state-of-the-art EDS technology?
12–1 p.m.	Lunch
1–2 p.m.	Quantitative EDS analysis – Improving accuracy in EDS measurements and ensuring you are not missing or misidentifying elements
2–2:30 p.m.	EBSD applications in failure analysis and materials R&D – What is possible with modern EBSD systems?
2:30–3:30 p.m.	Going from typical high speed EBSD analysis to high resolution – pushing limits with transmission EBSD

Parking information:

Visitor parking (payable by credit card) is available at North Annex Lot (9-minute walk) and Founder’s Court Visitor Lot (6-minute walk).

Location

Ralph S. O’Connor Building – Room 510 | Rice University

Date

August 12, 2025

8:45 a.m. — 3:30 p.m.

Business

NanoAnalysis

This workshop has reached capacity and registration is closed.

Please reach out to sonika.robertson@oxinst.com to more information.

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