Accelerating the breakthroughs that create a brighter future for our world

Aug
2
M&M 2026

We are excited to come together at M&M 2026 in Milwaukee, Wisconsin to showcase how our leading innovations can simplify your discovery and future-proof your lab space!

At Oxford Instruments, imaging is what we do. Our instruments enable researchers around the world to identify defects, understand root cause of failures, develop new materials, map behaviors, and so much more. We pride ourselves on developing solutions that achieve technical performance, improve your work flows, and prepare for your future needs with modularity.

Come to the booth to:

  • Advance your EBSD capabilities with live demos showcasing faster acquisition, improved pattern quality, and high-resolution strain and phase mapping.
  • Optimize your workflow—from sample prep to final analysis—by discovering integrated solutions that boost efficiency, reproducibility, and throughput.

  • Unlock the power of our software with hands-on sessions highlighting intuitive workflows, advanced analytics, and streamlined reporting tools.

  • Support your core facility with scalable solutions designed to serve diverse users, maximize instrument uptime, and simplify training and management.

  • Enhance your service and support experience by connecting with our team to learn how we help you maintain peak performance and long-term reliability.

Or join us in the technical program to:

  • Discover the latest advancements in EBSD including in-situ data processing, optimizing strain analysis with MapSweeper, and SEM integrated (EBSD-RISE) analysis.
  • Understand how to utilize EDS for real world biological and semiconductor problem solving through nanoscale chemical characterization
  • See the best sample preparation techniques for correlative microscopy analysis (Raman-EDS)

Location

Baird Center | Milwaukee, Wisconsin

Booth Number

730

Date

August 2 - 6, 2026

Businesses

Asylum Research, NanoAnalysis, NanoIndentation, Raman

M&M2024 Book your Demo Reserve your Vendor Tutorial seat

What's New for M&M 2026

Vendor Tutorials

Reserve your Vendor Tutorial seat

Please join us for our vendor tutorials, where you'll experience the analytical power of our technology firsthand. Each hour-long session walks you through key capabilities, giving you a clear understanding of how our tools can support your work.

SessionDateTimeTitle
Vendor TutorialTuesday, August 45:45 p.m.Getting More from EBSD with Pattern Matching
Vendor TutorialWednesday, August 55:45 p.m.All EDS systems offer Spectra, AutoID, Quant and Mapping, but not all are the same. Practical steps to see the difference.

Abstracts

Getting More from EBSD with Pattern Matching

This session outlines the most recent and exciting developments in pattern matching, how it works, practical use, and benefits across industrial and academic applications.

Pattern matching has been used for several years and has been proven to give better EBSD data, the approach has significantly improved the data quality and helped make EBSD more suitable for analysis of more challenging materials.

AZtecCrystal MapSweeper uses dynamic template matching, which generates reference patterns only when needed, making the method suitable for time-sensitive analyses. Compared with Hough indexing, pattern matching improves angular precision from 0.1° to <0.01° and improves indexing rate of low-quality EBSPs and the separation of phases with similar unit cells.

Overall, pattern matching extends the capabilities of EBSD by delivering more precise and reliable data, and faster time to result.

All EDS systems offer Spectra, AutoID, Quant and Mapping, but not all are the same. Practical steps to see the difference.

Surely all EDS systems are they same; they collect spectra, they identify the elements automatically, they provide a quant result, collect a map and a linescan. How reliable the results are, how fast they can be achieved and how far they can be pushed beyond their perceived limits, is where systems differ and where a bit of user know-how can make a significant difference.

In this session we will focus on how to use Oxford Instrument’s AZtec software and Ultim detectors to work differently. We will start by building a simple workflow that guarantees accurate results, whether qualitative, quantitative or mapping. We will then take that foundation and see how we can build on it to achieve a step-change in speed, sensitivity, certainty and capability.

This is a practical session after which you will be able to:

•Collect data much faster and know ways to benefit from that speed

•Push EDS to new levels of element detection and sensitivity

•Achieve high certainty about the quality of the results you are producing

•Expand your capability to tackle more difficult and challenging samples

•Do great quant!

Request a Demo

We’re excited to meet you at this year’s M&M. If you're interested in BEX, the latest in Raman microscopy, EDSEBSDAFM, or Nano indentation we’d love to show you more.

Request a demo and see how our solutions help you achieve outstanding results.

Not attending in person? No problem—we’re happy to set up a virtual demonstration at your convenience.

Fill out the form below to book your demo.

 

Symposium Presentations

Presentation TitleConference IDPresenterInstitutionDayTimeLocation
Resolving Overlapping Pattern Using Iterative Dynamic Template MatchingC05Prof. Grzegorz CiosAGH University of KrakowMonday, August 31:30-2:00 p.m.S103E
Automated in situ and Correlative EBSD, HR-DIC and EDS Characterisation of MaterialsA05Dr. Ali GholiniaUniversity of ManchesterMonday, August 32:45-3:00 p.m.S103E
In-situ data processing made easyA09Dr. Mark ColemanOxford InstrumentsMonday, August 33:00-5:30 p.m.12
A Novel SEM‑Integrated EBSD–RISE Strategy for Intrinsic, Model‑Free Calibration of Crystal Orientation in Polycrystalline MaterialsP05Dr. Ute SchmidtOxford InstrumentsTuesday, August 49:00 - 9:15 a.m.S103A
High-Throughput Crystallographic Mapping of Individual Nanoparticles Using Near-Axis Transmission Kikuchi DiffractionC05Alp Kulaksizoglu Northwestern UniversityTuesday, August 41:30-2:00 p.m.S103E
Advanced Elemental Analysis in Biology Using Cutting Edge SEM-BEX and EDS Technology B03Dr. Simon BurgessOxford InstrumentsWednesday, August 510:30-11:00 a.m.S101A
Small Features, Big Impact: Accurate Nanoscale Chemical Characterisation with EDS for Real‑World Biological and Semiconductor Problem SolvingA08Dr. Simon BurgessOxford InstrumentsWednesday, August 53:00-5:30 p.m.177
Evaluation of Metal Nanoparticles and Enzymatic Metal Deposition Reactions for Ultrastructural Localization of Antigens in Tissues by Immunoelectron Microscopy and BEX SEM AnalysisB03Mike ReicheltGenentechWednesday, August 53:00-5:30 p.m.221
Using technology to improve EBSD data quality on the SEMC04Kim LarsenOxford InstrumentsThursday, August 610:00-12:00 p.m.330
Optimizing Strain Analysis using MapSweeper Pattern MatchingP07Dr. Mark ColemanOxford InstrumentsThursday, August 610:00-12:00 p.m.366
Preparing Non Conductive Samples for Correlative Raman-EDS MicroscopyA08Dr. Ute SchmidtOxford InstrumentsThursday, August 64:15-4:30 p.m.S202 A