Accelerating the breakthroughs that create a brighter future for our world

Aug
2
M&M 2026

We are excited to come together at M&M 2026 in Milwaukee, Wisconsin to showcase how our leading innovations can simplify your discovery and future-proof your lab space!

At Oxford Instruments, imaging is what we do. Our instruments enable researchers around the world to identify defects, understand root cause of failures, develop new materials, map behaviors, and so much more. We pride ourselves on developing solutions that achieve technical performance, improve your work flows, and prepare for your future needs with modularity.

Come to the booth to:

  • Advance your EBSD capabilities with live demos showcasing faster acquisition, improved pattern quality, and high-resolution strain and phase mapping.
  • Optimize your workflow—from sample prep to final analysis—by discovering integrated solutions that boost efficiency, reproducibility, and throughput.

  • Unlock the power of our software with hands-on sessions highlighting intuitive workflows, advanced analytics, and streamlined reporting tools.

  • Support your core facility with scalable solutions designed to serve diverse users, maximize instrument uptime, and simplify training and management.

  • Enhance your service and support experience by connecting with our team to learn how we help you maintain peak performance and long-term reliability.

Or join us in the technical program to:

  • Discover the latest advancements in EBSD including in-situ data processing, optimizing strain analysis with MapSweeper, and SEM integrated (EBSD-RISE) analysis.
  • Understand how to utilize EDS for real world biological and semiconductor problem solving through nanoscale chemical characterization
  • See the best sample preparation techniques for correlative microscopy analysis (Raman-EDS)

Location

Baird Center | Milwaukee, Wisconsin

Booth Number

730

Date

August 2 - 6, 2026

Businesses

Asylum Research, NanoAnalysis, NanoIndentation, Raman

M&M2024 Book your Demo Reserve your Vendor Tutorial seat

What's New for M&M 2026

Vendor Tutorials

Please join us for our vendor tutorials, where you'll experience the analytical power of our technology firsthand. Each hour-long session walks you through key capabilities, giving you a clear understanding of how our tools can support your work.

SessionDateTimeTitle
Vendor TutorialTuesday, August 45:45 p.m.Getting More from EBSD with Pattern Matching
Vendor TutorialWednesday, August 55:45 p.m.All EDS systems offer Spectra, AutoID, Quant and Mapping, but not all are the same. Practical steps to see the difference.
Reserve your Vendor Tutorial seat

Request a Demo

We’re excited to meet you at this year’s M&M. If you're interested in BEX, the latest in Raman microscopy, EDSEBSDAFM, or Nano indentation we’d love to show you more.

Request a demo and see how our solutions help you achieve outstanding results.

Not attending in person? No problem—we’re happy to set up a virtual demonstration at your convenience.

Fill out the form below to book your demo.

 

Symposium Presentations

Presentation TitleConference IDPresenterInstitutionDayTimeLocation
Resolving Overlapping Pattern Using Iterative Dynamic Template MatchingC05Grzegorz CiosAGH University of KrakowMonday, August 31:30-2:00 p.m.S103E
Automated in situ and Correlative EBSD, HR-DIC and EDS Characterisation of MaterialsA05Ali GholiniaUniversity of ManchesterMonday, August 32:45-3:00 p.m.S103E
In-situ data processing made easyA09Dr. Mark ColemanOxford InstrumentsMonday, August 33:00-5:30 p.m.12
A Novel SEM‑Integrated EBSD–RISE Strategy for Intrinsic, Model‑Free Calibration of Crystal Orientation in Polycrystalline MaterialsP05Dr. Ute SchmidtOxford InstrumentsTuesday, August 49:00 - 9:15 a.m.S103A
High-Throughput Crystallographic Mapping of Individual Nanoparticles Using Near-Axis Transmission Kikuchi DiffractionC05Alp Kulaksizoglu Northwestern UniversityTuesday, August 41:30-2:00 p.m.S103E
Advanced Elemental Analysis in Biology Using Cutting Edge SEM-BEX and EDS Technology B03.2Dr. Simon BurgessOxford InstrumentsWednesday, August 510:30-11:00 a.m.S101A
Small Features, Big Impact: Accurate Nanoscale Chemical Characterisation with EDS for Real‑World Biological and Semiconductor Problem SolvingA08.P1Dr. Simon BurgessOxford InstrumentsWednesday, August 53:00-5:30 p.m.177
Using technology to improve EBSD data quality on the SEMC04Kim LarsenOxford InstrumentsThursday, August 610:00-12:00 p.m.330
Optimizing Strain Analysis using MapSweeper Pattern MatchingP07Dr. Mark ColemanOxford InstrumentsThursday, August 610:00-12:00 p.m.366
Preparing Non Conductive Samples for Correlative Raman-EDS MicroscopyA08Dr. Ute SchmidtOxford InstrumentsThursday, August 64:15-4:30 p.m.S202 A