Accelerating the breakthroughs that create a brighter future for our world

Jul
27
M&M 2025

We are excited to come together at M&M 2025 in Salt Lake City, Utah to showcase how our leading innovations can simplify your discovery and future-proof your lab space!

At Oxford Instruments, imaging is what we do. Our instruments enable researchers around the world to identify defects, understand root cause of failures, develop new materials, map behaviors, and so much more. We pride ourselves on developing solutions that achieve technical performance, improve your work flows, and prepare for your future needs with modularity.

Come to the booth to:

  • Have a unique demo experience just for you, utilizing EDS, EBSD, BEX, or RISE
  • Learn about the newest nanoindenter on the market, the iX05
  • Experience the ease of our AZtec software platform and get a first glimpse at new features
  • Discover how to save hours in EBSD strain analysis data processing
  • See the power of OI View – monitoring the health of your SEM in real time
  • Speak to a service representative
  • And so much more…

Or join us in the technical program to:

  • Discover how to optimize parameter for Near Axis TKD
  • Unlock strain analysis using MapSweeper parameters
  • Detect Lithium using the RISE technique
  • Improve measuring low concentration of overlapping elements with EDS

Location

Salt Palace Convention Center, Salt Lake City, Utah

Booth Number

1534

Date

July 27 - 31, 2025

Businesses

NanoAnalysis, WITec | Raman

M&M2024
Register for the conference now Book your Demo

What's New for M&M 2025

Meet Unity: The World’s First BEX Imaging Detector 

Unity redefines electron microscopy by merging Backscattered Electron and X-ray imaging into a single, high-speed technique—BEX. Launched at M&M 2023, Unity delivers instant, high-resolution images that combine topographic, crystallographic, atomic number, and elemental data in one view. 

Key Benefits:

  • 100x Faster: Image and analyze entire samples in minutes
  • All-in-One Imaging: Combines multiple data types into a single visual output
  • Smart Design: Dual-sensor head fits under the microscope pole-piece
  • Effortless Navigation: Simplifies complex analysis with intuitive workflows


Discover how Unity can transform your lab’s productivity and precision.


Nanoindentation: Mechanical Microscopy

Oxford Instruments’ nanoindentation systems deliver precise mechanical property measurements at the micro- and nanoscale—both in-lab and under real-world conditions.

Key Benefits:

  • In-Situ Innovation: FT-NMT04 is the world’s first MEMS-based SEM nanoindenter, offering unmatched resolution and repeatability inside SEM/FIB environments
  • Operando Performance: iX05 enables testing in extreme conditions—high/low temperatures, high strain rates, and liquid environments
  • Real-World Relevance: Quantify material behavior under application-specific conditions
  • Next-Gen Capability: Combine MEMS precision with environmental control for advanced mechanical microscopy


These systems redefine how researchers visualize and understand mechanical performance—making nanoindentation faster, more flexible, and more insightful.


    RISE Microscopy: Correlative Imaging, Redefined 

    RISE Microscopy seamlessly integrates Raman Imaging and SEM into a single instrument with a shared vacuum chamber—delivering unmatched chemical and structural insights in one workflow.

    Key Benefits:

    • Correlative Power: Overlay chemical and surface structure data with precision
    • Automated Workflow: Fast, hands-free switching between imaging modes
    • Enhanced Capabilities: Compatible with EDS, EBSD, and BEX detectors
    • High-Resolution Results: Achieve detailed, multi-modal analysis in minutes


    RISE brings together the best of spectroscopy and electron Microscopy—making complex analysis simpler, faster, and more powerful.


    alpha300 Series: Modular Raman Imaging for Evolving Research

    The alpha300 series offers a flexible, modular platform for confocal Raman imaging and correlative microscopy, built to adapt to your research needs—today and tomorrow.

    Highlights:

    • Customizable Configurations: Tailor systems for specific applications and workflows
    • Correlative Options: Integrates with AFM/SNOM, SEM, and inverted microscopy
    • Mobile & Versatile: Includes portable, research-grade Raman solutions
    • Advanced Particle Analysis: Features ParticleScout for Raman-based microparticle identification


    From foundational research to advanced materials analysis, alpha300 evolves with your science.

    Curious about what’s next in materials analysis? Join our experts in the booth for live insights and demos!

    Vendor Tutorials

    Please join us for one of our vendor tutorials. These are designed to let you get a flavor of the analytical power of the of our technology, first hand, as we walk you through some of the key capabilities in each hour long form.

    SessionDateTimePresenterPresentation Title
    Vendor TutorialTuesday, July 295:45 p.m.Lucia SpasevskiUltim Infinity & Unity to solve WDS-like applications
    Vendor TutorialWednesday, July 305:45 p.m.Ute SchmidtRISE, EDS & BEX: Modern analysis tools shedding light on the grey area

    Expert-Led Group Demo 

    Each Expert-Led Group Demo....

    DateTimePresenterTopic
    Tuesday, July 2912:30 p.m.Mark ColemanEBSD Strain Analysis Workflows - Acquisition to results in minutes
    Tuesday, July 291:30 p.m.Lucia SpasevskiUnity & Ultim Infinity:  A powerful combination bringing new capabilities to the SEM
    Wednesday, July 3012:30 p.m.Mark ColemanEBSD Strain Analysis Workflows - Acquisition to results in minutes
    Wednesday, July 301:30 p.m.Lucia SpasevskiUnity & Ultim Infinity:  A powerful combination bringing new capabilities to the SEM
    Thursday, July 3112:30 p.m.Mark ColemanEBSD Strain Analysis Workflows - Acquisition to results in minutes

    Request a Demo

    We’re excited to meet you face-to-face at this year’s M&M. If you're interested in BEX, the latest in Raman microscopy, EDS, WDS, EBSD, AFM, or NanoManipulation—or if you’d like to explore our benchtop Confocal Microscope that delivers stunning images at the push of a button—we’d love to show you more.

    Request a demo and see how our solutions help you achieve outstanding results.

    Not attending in person? No problem—we’re happy to set up a virtual demonstration at your convenience.

    Fill out the form below to book your demo.

     

    M&M Activities

    Our team of experts play an active role in this event, participating in a number of symposia and presenting papers, all revealing something that's new in EM Analytics or materials characterization. You can see the full details of our participation in M&M 2025, below.

    If you would like a personal demonstration, simply request one by completing the form.

    Symposium Presentations

    SessionDateTimePresenterPresentation TitleWorkflow ImprovementTechnical InnovationFuture-proofing
    A09.2Tuesday, July 2911:30-11:15 a.m.Mark ColemanNovel Transmission Diffraction Techniques and Applications
    C08.2Wednesday, July 3011:15-11:30 a.m.Mark ColemanUnlocking Strain Analysis using MapSweeper
    A07.P1Wednesday, July 303:00-5:00 p.m.Ute Schmidt Advances in SEM Instrumentation, Application and Techniques
    A08.2Thursday, July 312:30-2:45 p.m.Lucia SpasevskiNext Generation Microanalysis Standards For EPMA and SEM-EDS Calibration
    A07.P2Thursday, July 313:00-5:00 p.m.Lucia SpasevskiAdvances in SEM Instrumentation, Application and Techniques
    C06.P2Thursday, July 313:00-5:00 p.m.Phillip PinardAdvancements in Generative Artificial Intelligence and Automation for Electron Microscopy