Comprehensive sample characterization at the nanoscale

We are excited to be part of the Microscopy Society of Canda 2024 Meeting at the Carlton University in Ottawa, June 5-6, 2024.

Our table will showcase our wide variety of solutions, our EDS detectors, AFM, Raman to RISE Microscopy.

Ask us about our newest innovation, the Unity detector, the world’s first BEX imaging detector, which received an overwhelming response. Unity revolutionizes the field of scanning electron microscopy by combining Backscattered Electron and X-ray imaging techniques into a single, streamlined workflow. This groundbreaking technology has accelerated discovery and simplified workflows for researchers worldwide.

We look forward to meeting you in Ottawa.

June 7, 2024

Low kV SEM and EDS Workshop

This June there is an exciting opportunity to participate in a workshop on the final day of Microscopy Society of Canada 2024 Meeting in Ottawa.

Dr. Neil Rowlands enjoying his well-earned retirement from Oxford Instruments and Microanalysis is back to host a workshop focusing on what you can achieve when characterizing nanostructures using Low KV SEM and EDS. The workshop is being held at NRC, and will also include practical discussions around their Hitachi SU-5000 SEM with Oxford Instruments X-Max/AZtec EDS.

Neil will be joined by a team of experts in Nanoanalysis, to answer your questions, and help guide you through the potential and practicalities of Low kV SEM-EDS including Dr. Dave Kingston from NRC, Dr. Patrick Woo from Hitachi-Hitech Canada and Dr. Simon Burgess from Oxford Instruments Nanoanalysis in UK.

In this event you will have the opportunity to learn and see in action, low voltage imaging and elemental characterization, so come and see what is possible and how you can optimize your capabilities in high resolution imaging and analysis on the SEM.

Attendance is limited, and on a first come first served basis, so if you are attending the Microscopy Society of Canada Meeting, or can be in Ottawa on June 7 please join us.