The Microscopy of Semi-Conducting Materials Conference focusses on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques including scanning probe microscopy, X-ray topography and diffraction are also featured. Developments in materials science and technology covering the complete range of elemental and compound semiconductors feature as well.
Oxford Instruments will be exhibiting its latest product innovations at the conference. Stop by our booth and have a chat with our experts!
Oxford Instruments Electron Microscopy products enable you to accurately analyse and characterise materials down to the nanoscale level more rapidly, by combining superior detection and analysis instruments with software platforms that interpret the resulting data in the context of your research.
Supported by our AZtec software platform, our EDS detectors give you accurate compositional analysis in real time, while our WDS quantifies minor and trace elements with unmatched speed and flexibility.
For microstructural detail, the new Symmetry S3 detectors give unrivalled acquisition speeds, pattern resolution and sensitivity. The resulting certainty allows you to innovate with confidence and redefine the Art of the Possible.
The Cypher AFM, routinely achieves higher resolution than other AFMs and is available with a full range of operating modes, environmental controls, and even video-rate scanning.