Mastering AFM Imaging

Oxford Instruments applications scientists will lead an in-person, two-day course which will aim to expand your skills and understanding to achieve mastery of imaging with an AFM.

Using a combination of lectures and hands-on equipment time, our experts will help you relay the foundations and build an in-depth understanding of the process and considerations needed to achieve excellent images across an array of sample types.

This course is aimed at all AFM users and is not specific to Oxford Instruments equipment, however users who are completely new to AFM may find the course content challenging. Space is limited and the class will be filled on a first-come first-served basis so sign-up and reserve your spot now.

Key Features

The key outcomes of the course will be:

How to successfully image in contact and tapping mode, by adjusting and selecting the correct probe and parameters for your sample.

This course will use a mixture of theoretical discussions and live practice to deliver the teaching outcomes.

• 6 places are available for the in-person course, hosted at Concord, MA
• This course will be delivered across two consecutive days, from 14th - 15th April
• A quiz must be completed to receive a certificate of achievement

Course Details

Intro to AFM

• What is an AFM?
• What can you measure with an AFM?
• The AFM Probe
• AFM Schematic Diagram
• MFP-3D vs. Cypher vs. Jupiter AFMs

Contact Mode Imaging

• What are the basic imaging modes?
• Contact mode operation
• Deflection Signal
• Feedback control (AFM height feedback loop)
• Deflection Setpoint
• Raster scanning in contact mode

Tapping Mode Imaging

• Tapping mode operation
• Driving the cantilever into sinusoidal oscillation
• Amplitude Signal
• Feedback control system (AFM height feedback loop)
• Amplitude Setpoint
• Raster scanning in tapping mode
• Contact Mode vs. Tapping Mode imaging

Understanding Phase

• Phase Signal
• Dynamic force curves: amplitude and phase vs. distance
• What happens to amplitude and phase when the tip interacts with the surface (i.e., the cantilever resonance shifts)?
• Setpoint and phase
• Free amplitude and phase
• What does phase contrast mean?
• Phase imaging

Practical AFM

• How to adjust parameters for successful contact mode imaging
• How to adjust parameters for successful tapping mode imaging
• How to pick the right AFM probe
• How to identify different image artifacts

Survey of Advanced AFM Modes

• Nanomechanical Modes
• Nanoelectrical Modes

As this is an introductory course there is no work required in advance of the course. However, during the sign up we will ask you a few questions about your experience and learning aims, to help better tailor the course to your needs. Additionally, all materials that are required for the completion of the course will be provided, so you just need to bring a desire to learn.

Certification will be provided on the completion of the accompanying course workbook, which includes practical exercises related to all the sections above.