Mastering AFM for 2D Materials Research - Graphene Cutting & Moiré Imaging

Join us for an intensive training course focused specifically on AFM of 2D materials and jumpstart your research by learning tips and tricks from the experts. Our knowledgeable Applications Scientists will host two separate 3-hour remote training modules.

Using a combination of lectures, demonstration, and “hands-on” lab component to solidify your knowledge, you will directly practice the techniques and tricks you have learned with real 2D materials samples in a real AFM across two sessions. The first session is focused on graphene cutting and the necessary environmental conditions and operating parameters needed for successful cutting. The second session is focused on imaging the moiré of twisted 2D materials through techniques such as Torsional Force Microscopy (TFM) and Piezoresponse Force Microscopy (PFM).

This course is aimed at 2D Materials researchers who have an interest in using AFM to cut graphene and/or image the moiré of twisted 2D material samples. Space is limited and the class will be filled on a first-come first-served basis so sign-up and reserve your spot now.

Key Features

The Key outcomes of the course will be:

• Reliably cut graphene with AFM nanolithography.
• Image the moiré of twisted 2D material samples consistently with a variety of imaging techniques.
• Learn about safe operating ranges for safely imaging these 2D material samples.

This course will use a mixture of lectures and live demonstrations to deliver the teaching outcomes.

While we will be remotely using Oxford Instruments Asylum AFMs for the labs, the knowledge you gain will be generally applicable to most other AFMs

This course will be attended remotely, through teams.

It will be held at Pacific Time.

Course Agenda

• Module 1: Graphene cutting
  • Understanding the principles of graphene cutting and variables that affect the process.
  • Learn a general workflow
  • Probe selection

• Module 2: Imaging Moiré of Twisted 2D materials
  • General imaging strategies to increase productivity
  • Torsional Force Microscopy
  • Piezoresponse Force Microscopy

• Module 3: Image Your Own Sample with an Applications Expert (Optional Add-On)
  • Image a sample from your own lab or receive individualized advanced training.

There is no work required in advance of the course. However, during the sign up we will ask you a few questions about your experience and learning aims, to help better tailor the course to your needs.

As this is a remote course accessed through teams you will require a computer with a stable internet connection. It is not necessary to have teams preinstalled, or to have an account with teams. The invitation that is sent out will allow you to join via the web application as a guest. Having access to a microphone and webcam would improve the experience.