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M&M 2024

We are excited to sponsor and be part of M&M 2024 at the Huntington Convention Center in Cleveland, Ohio, July 28 – August 1, 2024.

At last year's event, we proudly introduced Unity, the world’s first BEX imaging detector, which received an overwhelming response. Unity revolutionizes the field of scanning electron microscopy by combining Backscattered Electron and X-ray imaging techniques into a single, streamlined workflow. This groundbreaking technology has accelerated discovery and simplified workflows for researchers worldwide.

In 2023, we introduced the alpha300 Semiconductor Edition, designed specifically for Raman imaging of up to 300 mm wafers. This innovation was made possible by the modular design of our instrument and our commitment to meeting the evolving needs of the R&D community.

FemtoTools, a developer of high-speed, high-precision nanoindentation instruments, is now part of Oxford Instruments! We offer both in-situ SEM Nanoindenters and standalone systems which are highly complementary to our Electron Microscopy analytical techniques, such as EDS and EBSD. These products lead the way in Mechanical Microscopy, the imaging of mechanical properties across a sample through rapid sequential nanoindentation

During this year's event, we will showcase these cutting-edge technologies along with other conventional electron microscope analytics. We will also announce exciting developments currently in the pipeline and offer live demonstrations of our latest innovations.

We look forward to welcoming you at Booth #410 in Cleveland.

Lots to see

Not only do we have a lot that is new to talk to you about, but our team of experts will also be participating in many activities during the event. As well as hosting several symposia and presenting a number of papers, we are offering two vendor tutorials, two Lunch and Learn events and a full schedule of State-of-the-Art sessions. Discover more of what we have planned for this year at M&M 2024, here, including booking a demo.


Huntington Convention Center, Cleveland, Ohio


July 28 - August 1, 2024


NanoAnalysis, WITec | Raman

Find out more M&M2024
Register for the conference now Book a demo

What's New for M&M 2024

We are hosting a extensive programme of on-booth sessions at M&M 2024. 

Vendor Tutorials

Please join us for one of our vendor tutorials. These are designed to let you get a flavor of the analytical power of the of our technology, first hand, as we walk you through some of the key capabilities in each hour long form.

SessionDateTimePresenterPresentation Title
Vendor TutorialMonday, July 295:45 pmHaithem MansourUnity: making imaging elementary
Vendor TutorialTuesday, July 305:45 pmUte Schmidt & Joshua LeaCombining confocal Raman with ultrastructural SEM imaging: A practical approach to RISE microscopy

State-of-the-Art Sessions

Each presentation in our State-of-the-Art series will focus on one or two aspects of a given SEM analytical technology or technique to discuss some of most exciting associated developments with it. These will be held during the scheduled coffee breaks on each day, lasting around 15 minutes. Please join us to learn about some of the hottest new developments in SEM analytics.

Monday, July 293:15 PMKim LarsenThe advantage of NA-TKD with Symmetry S3
Tuesday, July 303:15 PMHaithem MansourHow the new BEX technique is changing the way we use SEM
Wednesday, July 3110:15 AMPedro MachadoCorrelate and analyse multimodal microscopy with Relate
Wednesday, July 313:15 PMSandy LariosRemote & real-time lab management with Oi View
Thursday, August 110:15 AMJosh LeaFrom composition to chemistry: BEX & Raman in the SEM

Lunch & Learn

Oxford Instruments likes to bring you food for thought, and in that vein, we are hosting two lunchtime events in order to share on exciting news in the world of SEM analysis.

  • Abstracts available shortly

Both lunch & Learn sessions are being held between 12 and 1pm in Salons F, G, H at the Cleveland Marriott Downtown at Key Tower hotel, next to the conference center. A boxed is lunch is included. Spaces are limited and will be allocated on a first-come-first served, basis.

DateTimePresenterPresentation Title
Monday, July 2912:00 pmSimon BurgessCutting edge EDS technology – what’s the difference?
Tuesday, July 3012:00 pmUte Schmidt & Joshua LeaRISE Microscopy: The Benefits of Correlative Scanning Electron and Confocal Raman Microscopy

Presentation Abstracts and Key Learning

Cutting edge EDS technology – what’s the difference?

What is cutting edge in EDS technology today? The capabilities of EDS hardware and software have changed so much since I first sat in front of a SEM 30 years ago. Starting with the output from an X-ray detector, we will look into this difference from a number of perspectives, to demonstrate the how and why we can achieve so much more sensitivity, accuracy and speed. We will also provide insights on how we can overcome specific challenges for nano- and micro-analysis and the newly emerging area of SEM based X-ray imaging and BEX (backscatter and X-ray imaging). This is an educational session, we hope will be thought provoking, rather than cause indigestion, aimed at linking theory to capability to help us understand where the boundaries of X-ray analysis may now lie.

Key learning objectives:

  • Detector fundamentals and how they influence different types of analysis using EDS
  • How the signals coming from a detector are converted to output you see on your EDS software screen, focussing on barriers and how they may be overcome
  • What may be considered cutting-edge today and what is now more routine

RISE Microscopy: The Benefits of Correlative Scanning Electron and Confocal Raman Microscopy

Correlating Raman, SEM and EDS data from the same measurement position helps researchers obtain greater insight regarding the relationship between a sample’s surface properties and its molecular and atomic composition. Combining these three methods in one instrument with a common vacuum chamber enhances user-friendliness, accelerates experimental workflow, and increases sample turnover. This seminar will be of interest to materials scientists, physicists, chemists, biologists and any researchers looking to investigate both the form and function of sample components.

Key learning objectives:

  • An introduction to the theoretical background and hardware considerations related to RISE microscopes
  • A description of available technique variations, including 3D Raman imaging, particle analysis, and energy-dispersive X-ray spectroscopy (EDS)
  • Application examples from fields including bio-inspired materials, polymers, pharmaceutical research, semiconductors, 2D materials, geoscience, and biominerals.

Reserve your ticket

Reserve your ticket here

Request a Demo

We were excited meet you face to face at M&M, this year. If you're interested in BEX or the latest in Raman microscopy, EDS, WDS, EBSD, AFM or NanoManipulation, or would like to see the benchtop Confocal Microscope which delivers amazing images at the push of a button, please request a demo. We’d be delighted to show you how our solutions can help achieve great results.

Can't make it in person? We'd be delighted to set up a virtual demonstration for you.

Please fill out the form below to book your demo.


M&M Activities

Our team of experts play an active role in this event, participating in a number of symposia and presenting papers, all revealing something that's new in EM Analytics or materials characterization. You can see the full details of our participation in M&M 2024, below.

If you would like a personal demonstration, simply request one by completing the form.

Symposium presentations

SessionDateTimePresenterPresentation Title
B06.1Wednesday, July 319 amAnthony HydeThe installation and operation of SEM-EDS analysis in a regulated environment
A10.7Wednesday, July 312 pmJames SagarA correlative look at a battery cathode
A10.7Wednesday, July 312:30 - 2:45 pmMarkus BoeseCorrelative EDS and Raman spectroscopy (Data acquired in collaboration with U. Schmidt, T. Meyer, et al.)
A07.P1Wednesday, July 313 pmPhillip PinardCharacterization and customization of individual EDS detectors to improve X-ray microanalysis
A11.P1Thursday, August 110 amKim LarsenImproving transmission Kikuchi diffraction workflows
A10.9Thursday, August 11:30 - 1:45 pmUte Schmidt Characterization of dislocations in GaN wafers using correlative microscopy: A Raman-SEM-EDS and AFM study
A05.2Thursday, August 14 pmLucia SpasevskyState of the art SEM-based, electron, X-ray and Raman imaging and analysis reveals century old secrets: Case of a 19th century wooden inventory
C05.4Thursday, August 14:30 pmPedro MachadoCorrelative Raman, backscattered electron and X-ray imaging and energy dispersive x-ray spectrometry uncovers unique chemical signatures surrounding nanoparticles and wear debris in periprosthetic tissue.