Meet Oxford Instruments at ISTFA 2022

Share your experiences and stories of chasing the ever-smaller and more elusive defects at the 48th International Symposium for Testing and Failure Analysis, the premier event for the microelectronics failure analysis community. We invite you to submit your work for publication and to present to the industry in Pasadena, California, at the 48th year of ISTFA.

We're looking forward to meeting you at the event and discussing your current work and workflows with you. If you would like to book a meeting with us at the show, please complete the form below.

For further information: ISTFA 20122.