Visit Us at Booth A17!

We are excited to announce that Oxford Instruments will be participating at the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2026! Join us from July 14 – 16, 2026 at Marina Bay Sands, Singapore, explore our latest solutions, and listen to our presentation!

Understand OI’s Solutions for Semiconductor Applications

• Failure Analysis: Leverage our high-throughput imaging systems and analytical tools to perform detailed failure analysis. Quickly identify defects and root causes to enhance yield rates and improve design performance.
• Inspection and Process Control: Our integrated metrology solutions provide real-time monitoring and inspection throughout the semiconductor fabrication process. Detect anomalies early and ensure quality standards to optimize productivity and maintain consistency.
• Integrated Metrology Solutions: Discover our systems dedicated to process control and metrology, ensuring precision and reliability throughout the semiconductor manufacturing workflow.

➨ Learn more about our solutions for Semiconductor Applications.

Book a 1:1 meeting with our experts on-site!