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Jul
13
IPFA 2026

Welcome to IPFA 2026!

Join us at the 2026 IEEE International Conference on Integrated Photonics for Advanced Applications (IPFA 2026) to explore groundbreaking developments in photonics and enhance your expertise with the latest industry advancements.

Understand OI’s Solutions for Semiconductor Applications

  • Failure Analysis: Leverage our high-throughput imaging systems and analytical tools to perform detailed failure analysis. Quickly identify defects and root causes to enhance yield rates and improve design performance.
  • Inspection and Process Control: Our integrated metrology solutions provide real-time monitoring and inspection throughout the semiconductor fabrication process. Detect anomalies early and ensure quality standards to optimize productivity and maintain consistency.
  • Integrated Metrology Solutions: Discover our systems dedicated to process control and metrology, ensuring precision and reliability throughout the semiconductor manufacturing workflow.

Learn more about our solutions for Semiconductor Applications.

Book a 1:1 meeting with our experts on-site!


Location

Marina Bay Sands, Singapore

Booth Number

#A17

Date

13 - 16 July 2026

Register Now!

Visit Us at Booth A17!

Don’t miss the opportunity to connect with us at Booth A17! Our team will be available to:

Our solutions are designed to enhance your capabilities and drive success in your projects and production.
Please visit us at Booth A17 to share insights and receive feedback on semiconductor manufacturing techniques and analysis.

We look forward to meeting you and exploring potential collaborations!

Poster Session

We encourage participation in our poster sessions, where you can engage with our experts. This year’s poster session features:

Poster Session｜July 15th｜10:30 am to 11:35 am 
Exhibition Hall ORCHID Main Ballroom, POS3.09, ID 237

From Pad to Intermetallic: Rapid SEM EDS Analysis of Cu Wire Bonds with New Workflow Using BEX and Extreme EDS

Lucia Spasevski
Product Manager, Oxford Instruments


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