Meet Oxford Instruments Experts at IPFA 2025!

We're excited to participate in IPFA 2025, the International Symposium on the Physical & Failure Analysis of Integrated Circuits in Malaysia. This premier forum brings together global experts in physical and electrical characterization, reliability testing, failure analysis, and semiconductor manufacturing to address the latest challenges in ensuring robust integrated circuits.

Join us to explore the newest innovations and best practices in physical and failure analysis for semiconductor fabrication and electrical characterization. Visit our booth to speak with our experts and discover how we can collaborate to improve the reliability and performance of your semiconductor devices.

Should you have any questions or need further information, please feel free to reach out via jkast.marketing@oxinst.com.

For detailed information on the conference program and schedule, please visit https://ipfaieee.org/2025/