AFM Fundamentals Training Course

Work alongside Asylum Research applications scientists in a hands-on introductory Atomic Force Microscopy (AFM) course. This two-day class is aimed at those who are new to AFM or who would like to sharpen their fundamental AFM skills. Through a combination of lectures and hands-on experiments students will learn how to perform basic measurements using the latest Asylum Research AFMs.

Course material will include topographic imaging using contact and tapping modes, probe selection, and basic image modification and analysis. Additionally the course will survey nanomechanical and nanoelectrical measurements. Attendees may choose to add an additional day to their stay, during which they will work with Asylum applications scientists to image samples brought from their own labs or receive advanced training. Students will receive a certificate of completion at the end of the course. 

Who Should attend?

Academic researchers and industrial users who are either new to AFM or looking to strengthen fundamental AFM skills.

Pricing

$1,950 per attendee for the  two-day course. An optional third day of individualized training can be included for an additional $1,650. 

Course Schedule 

Day 1

• • Understanding the principles and operation of AFM for topographic imaging, including contact and tapping modes
  • Optimization of image quality, and identification and elimination of artifacts

Day 2

• • Basic image modification and use of image analysis tools
  • Explanation of the full capabilities of AFM including nanomechanical and nanoelectrical measurements

Day 3 (Optional)

• • Image a sample from your own lab or receive individualized advanced training about a topic of your choosing!

Registration info

The registration deadline is January 26, 2020. Space will be limited.