Course

Introduction to Atomic Force Microscopy

AFM Imaging Fundamentals Training Course

Work alongside Asylum Research applications scientists in a hands-on introductory Atomic Force Microscopy (AFM) course. This two-day class is aimed at those who are new to AFM or who would like to sharpen their fundamental AFM skills. Through a combination of lectures and hands-on experiments students will learn how to perform basic imaging measurements using the latest Asylum Research AFMs.

Course material will include topographic imaging using contact and tapping modes, probe selection, and basic image modification and analysis. Additionally, the course will survey nanomechanical and nanoelectrical measurements. Students will receive a certificate of completion at the end of the course.

Who Should attend?

Academic researchers and industrial users who are either new to AFM or looking to strengthen fundamental AFM skills.

Pricing

$2,300 per attendee for the two-day course. An optional third day of individualized 1:1 training can be included for an additional $1,950.

Course is limited to a maximum of 8 registrants.

Optional 1:1 training add-on is subject to limited availability.

Register Now

Location

Santa Barbara, California, USA

Date

September 17–18, 2024

Business

Asylum Research

Travel and Lodging

For directions and hotel information click here.

Questions?

Contact AFM.Support@oxinst.com

Testimonials from Past Courses

"Great class. Loved the balance between lecture and hands on time."

"Good balance of information and practical applications....This [class] has been fantastic and incredibly helpful. Everyone from Oxford and Asylum were amazing!!! Thank you!"

    "Keith J. was very knowledgeable about the science of AFM. He did an awesome job with conveying the information and keeping the attention of the class."

    About the Instructor

    Keith Jones has 25+ years of experience in SPM, specializing in nanoelectrical characterization. He was instrumental in developing and applying electrical AFM techniques, such as dopant profiling and scanning microwave impedance microscopy. Keith is also a co-inventor on a patent for scanning impedance microscopy and has co-authored 40+ published papers.

    Course Schedule

    Day 1

      • Understanding the principles and operation of AFM for topographic imaging, including contact and tapping modes.
      • Optimization of image quality, and identification and elimination of artifacts.
      • Probe selection and tips.

    Day 2

      • Basic image modification and use of image analysis tools.
      • Survey of the expanded capabilities of AFM including nanomechanical and nanoelectrical measurements.

    Day 3 (Optional Add-On)

      • Image a sample from your own lab or receive individualized advanced training about a topic of your choosing!


    Equipment

    The course will use the following Asylum AFMs:

    Cypher

    Cypher-VRS

    Jupiter XR

    Jupiter XR

    MFP-3D

    MFP-3D

    Payment 

    Registrants may choose to pay with credit card or purchase order. Please indicate your preference on the registration form and we will follow up with further details.

    Questions

    For questions related to this course please contact AFM.Support@oxinst.com.

    Course and Travel Information

    Attendees are responsible for all travel, hotel, and meal costs, except lunch, which will be included daily and one group dinner on the first night. Your seat for the course will be confirmed after the registration deadline (August 23, 2024). The minimum number of participants is 6, if there are fewer, then the course will be cancelled and any paid registrants will have the option to register in a future course or be fully refunded. Attendees are therefore advised to avoid making non-refundable travel arrangements before the course is confirmed.