International Materials Research Congress (IMRC)

The Sociedad Mexicana de Materiales (SMMater) and the Materials Research Society® (MRS) are pleased to invite you to attend the 33rd International Materials Research Congress (IMRC2025), scheduled for August 17-21, 2025.

Both societies are excited to be working together on the organization of the IMRC, held annually in Cancún, México.

Oxford Instruments invite you to a workshop on the latest advancements in Structural and Chemical Characterization and Correlating Raman Imaging at IMRC 2025 in Cancun, Mexico.

Drop by our booth to discuss our custom solutions for your research needs. We're looking forward to meeting you at the event and discussing your current work and workflows with you.

For more information go to: IMRC.

Tech Talks:

Tuesday, August 19, 2025 11:30 - 13:00

What can I see with an Atomic Force Microscope?

Advanced AFM Modes for Materials Characterization

Dr. Fernando Vargas

High-performance atomic force microscopes (AFMs) like Oxford Instrument’s Cypher, Vero, or Jupiter routinely visualize nanometer-sized topographic features of surfaces down to atoms and point defects. This is achieved using a super-sharp stylus (typically <10 nm at the tip) that essentially “touches” the surface with exquisitely controlled interaction forces. In addition, contact or proximity to the surface allow us to simultaneously interrogate materials properties such as their mechanical, electrical and magnetic response. We can thus obtain very local information that enables us to correlate these properties to nanometer-sized topographic features to better understand the performance of materials.

In this presentation, we will survey advanced AFM modes that measure properties such as Young’s modulus, adhesion, and viscoelastic response; current and capacitance; contact potential and work function; static charge and magnetic field gradients; and, finally, electromechanical or piezoelectric response.

These various measurement modes, combined with its nano-scale resolution, highlight the strength and versatility of AFMs in materials characterization and nanotechnology research.

Confocal Raman Imaging: High Resolution Chemical Mapping and Beyond

Ted Limpoco, PhD

Raman spectroscopy combined with confocal microscopy is a powerful technique for 2D and 3D chemical mapping of materials. Oxford Instruments is a leading manufacturer of confocal Raman imaging solutions. Our systems achieve the highest speed, sensitivity, and resolution—without compromise. Our modular design provides the versatility and flexibility to configure each system to be optimized for specific applications. They are designed to fit the individual requirements of our customers and to grow with their research.

Oxford Instruments’ confocal Raman microscopes can also be integrated with AFM, SEM, SNOM or Raman-based particle analysis as correlative systems for investigating both chemical and structural properties of samples. This talk will give a brief introduction to confocal Raman microscopy and an overview of Raman-imaging solutions offered by Oxford Instruments along with corresponding applications.

Tuesday, August 19, 2025 14:00 - 15:45

New capabilities to your SEM: EDS Infinity and BEX technologies, the most powerful combination.

Héctor Olivares

Infinity detectors are the new generation of Ultim EDS detectors from Oxford Instruments. This generation offer new capabilities to enable EDS to solve more complex challenges or to solve the routine ones, faster and more reliably. Fast characterization of minor and trace elements. With Infinity and Tru-Q IQ processing many applications that are thought to require WDS can now be done faster and of course much more easily using EDS.

The Backscattered Electron and X-ray (BEX) technique is revolutionizing elemental analysis in the Scanning Electron Microscope (SEM). Its unique geometry, sensitivity and speed are pushing the boundaries of what’s possible with elemental analysis in the SEM: Achieved sub 10nm X-ray spatial resolution in SEM, detect levels of segregation <1wt%, Increase productivity by 120 times and more.

Please join us if you want to know more about the latest cutting-edge SEM characterization technologies and how they are helping to go over the current limits.