Advancing materials understanding to power future breakthroughs

Aug
31
IMC21

We are excited to come together at IMC21 in Liverpool, UK, to showcase how our leading innovations in materials characterisation and imaging can simplify discovery and help future-proof your laboratory.

At Oxford Instruments, imaging is at the heart of what we do. Our advanced technologies enable researchers worldwide to characterise materials with confidence from identifying defects and understanding root causes of failure to mapping behaviours and developing the next generation of materials.

Come to the booth to:

  • Advance your EBSD, EDS and BEX capabilities with live demos showcasing faster acquisition, improved pattern quality, and high-resolution strain and phase mapping.
  • Optimize your workflow from sample prep to final analysis by discovering integrated solutions that boost efficiency, reproducibility, and throughput.

  • Support your core facility with scalable solutions designed to serve diverse users, maximize instrument uptime, and simplify training and management.

  • Enhance your service and support experience by connecting with our team to learn how we help you maintain peak performance and long-term reliability.

  • Expand your Life Science expertise with live demos showing how rapid, high-quality fluorescence imaging can simplify workflows, accelerate insight generation, and make advanced microscopy accessible to users of all experience levels.

Location

Liverpool Experience Campus | Liverpool, UK

Booth Number

247

Date

31 August - 4 September 2026

Businesses

Andor, Asylum Research, NanoAnalysis, NanoIndentation, Raman

IMC21 Book a meeting Book a Demo

What's New for IMC21

Book a meeting 

We’re excited to meet you at this year’s IMC21. Book a meeting with one of our experts to explore how our technologies can support your research.

Book your meeting with our specialist

Book a Demo

We’re excited to meet you at this year’s IMC21. If you're interested in  BEX, EDSEBSD or Life Science workflows we’d love to show you more.

Request a demo and see how our solutions help you achieve outstanding results.

Not attending in person? No problem—we’re happy to set up a virtual demonstration at your convenience.

Book a Demo

OmniProbe allows you to work quickly, confidently, and without the risk of sample loss, simplifying advanced workflows and delivering high throughput lift-out. Designed and optimised for TEM lamella preparation in FIB-SEM, our 9th generation nanomanipulators are powered by piezoelectric motors and closed loop control for reliable, repeatable performance.

Nanomanipulators
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AZtecHKL is a powerful EBSD software platform that combines fast, accurate data acquisition and analysis with the flexibility required for advanced materials characterisation. Delivering real-time results, it maximises the performance of the Symmetry S3, the world’s most sensitive CMOS-based EBSD detector. The software also supports seamless simultaneous EBSD and EDS acquisition through AZtecSynergy and is optimised for nanoscale orientation mapping using Transmission Kikuchi Diffraction (TKD), making it ideal for both routine analysis and cutting-edge research applications.

AZtecHKL
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The Jupiter Discovery Atomic Force Microscope offers a unique combination of best-in-class performance along with exceptional ease of use. Whether in academia or industry, researchers expect high quality results with less training and effort. At the same time, today’s AFM measurements demand higher performance as users strive to resolve finer details and achieve higher accuracy, repeatability, and throughput. The Jupiter Discovery is the only AFM that meets these needs, delivering both the ultra-high performance and the exceptional usability that researchers need.

Jupiter Discovery AFM
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Symposium Presentations

Presentation TitleConference Session Name/Poster SessionPresenterInstitutionDayTimeLocation
Intrinsic, Model‑Free Crystal Orientation Calibration Using an SEM‑Integrated EBSD–RISE Correlative Workflow.Earth and Planetary MaterialsStefan KreisslOxford InstrumentsMonday, 31 August, 2026, 14.40 - 14.55Room 11C
Using technology to improve EBSD data quality on the SEMPoster Session 1Kim LarsenOxford InstrumentsMonday, 31 August, 202617:30-18:30Exhibition Hall
Automation, Reproducibility and Precision with Image Analysis Workflows in ImarisPoster Session 1 Anna PaszulewiczOxford InstrumentsMonday, 31 August, 2026,17:30-18:30Exhibition Hall
An AI-powered dynamic shadow mask for EBSDPoster Session 2Robert MastersOxford InstrumentsTuesday, 1 September, 2026,17:30-18:30Exhibition Hall
Advances in EDX methods: detecting and quantifying micro-segregation in industrial grade stainless-steelPoster Session 3 Haithem MansourOxford InstrumentsWednesday, 2 September17:30-18:30Exhibition Hall
In-situ EBSD data processing made easyPoster Session 3 Mark ColemanOxford InstrumentsWednesday, 2 September, 202617:30-18:30Exhibition Hall
Correlative AFM–Raman–EDS Characterisation of Defects in ALD Grown MoS₂ Thin FilmsPoster Session 4 Kate StokesOxford InstrumentsThursday, 3 September, 202617:30-18:30Exhibition Hall
Enabling Correlative Raman–EDS Studies of Non‑Conductive Samples Through Advanced Preparation MethodsPoster Session 4 Stefan Kreissl/Josh LeaOxford InstrumentsThursday, 3 September, 2026,17:30-18:30Exhibition Hall
A Correlative Imaging Approach for Comprehensive Analysis of 2D Material HeterostructuresPoster Session 4 Stefan Kreissl/Josh LeaOxford Instruments Thursday, 3 September, 202617:30-18:30Exhibition Hall
The New Toran sCMOS Camera: Setting New Standards in Productivity and Imaging FlexibilityPoster Session 4 Alan MullanOxford InstrumentsThursday, 3 September, 2026,17:30-18:30Exhibition Hall