Join us at EMC 2024 - Oxford Instruments

Aug

We are excited to sponsor and be part of EMC 2024 at the Bella Centre in Copenhagen, August 25 -30 2024.

EMC2024 is the 17th of its kind and will bring the world of scientific imaging together in one of Europe’s most beautiful cities - Copenhagen, Denmark.

Incorporating a balanced conference program of all kind of microscopy in both physical and life sciences - microscopists, manufacturers, and suppliers will come together to share new techniques, applications, and technology.

Last year, we proudly introduced Unity, the world’s first BEX imaging detector, which received an overwhelming response. Unity revolutionises the field of scanning electron microscopy by combining Backscattered Electron and X-ray imaging techniques into a single, streamlined workflow. This groundbreaking technology has accelerated discovery and simplified workflows for researchers worldwide.

In 2023, we introduced the alpha300 Semiconductor Edition, designed specifically for Raman imaging of up to 300 mm wafers. This innovation was made possible by the modular design of our instrument and our commitment to meeting the evolving needs of the R&D community.

FemtoTools, a developer of high-speed, high-precision nanoindentation instruments, is now part of Oxford Instruments! We offer both in-situ SEM Nanoindenters and standalone systems which are highly complementary to our Electron Microscopy analytical techniques, such as EDS and EBSD. These products lead the way in Mechanical Microscopy, the imaging of mechanical properties across a sample through rapid sequential nanoindentation

During this year's event, we will showcase these cutting-edge technologies along with other conventional electron microscope analytics. We will also announce exciting developments currently in the pipeline and offer live demonstrations of our latest innovations.

We look forward to welcoming you at Booth C10 in Copenhagen

Lots to see

Not only do we have a lot that is new to talk to you about, but our team of experts will also be participating in many activities during the event including presenting a number of papers and posters Discover more of what we have planned for this year at EMC 2024, here, including booking a demo.

Unity

Unity - the World’s first BEX imaging detector – was launched at M&M 2023. It works by combining Backscattered Electron and X-ray imaging into a single technique – BEX. Unity makes it easier than ever before to image and analyse an entire sample in minutes, due to the high-speed of BEX data collection, and can boost microscope productivity by up to 100x. Fundamental to the speed and power of Unity is its unique design. It combines two types of sensors within one detector head and sits under the microscope pole-piece. The game-changing Unity detector combines the topographic, crystallographic, atomic number and elemental information into an instant high-resolution visual output. So, users can effortlessly navigate around the sample, and sophisticated analysis can be simpler and faster than ever. Learn more about the BEX technique.

FT-NMT04 Nanomechanical Testing System

The FT-NMT04 Nanomechanical Testing System is a versatile in-situ SEM/FIB nanoindenter capable of accurately quantifying the mechanical behavior of materials at the micro- and nanoscale. As the world’s first MEMS-based in-situ SEM nanoindenter, this system features unmatched resolution, repeatability, and dynamic range.

RISE Microscopes: Raman-SEM Systems

RISE Microscopy is a novel correlative technique that integrates Raman Imaging and SEM within one instrument featuring a common vacuum chamber. Automated shuttling between measurement positions enables the fast, convenient overlay of chemical characterisation and structural surface properties at the highest resolution. EDS, EBSD, and BEX detectors from Oxford Instruments NanoAnalysis can further enhance these systems’ capabilities. To find out more

alpha300 Series: Modular Raman Imaging and Correlative Microscopes

The alpha300 series is a versatile, modular line of confocal Raman imaging and correlative microscopes that can be configured for individual requirements and evolve along with experiments. Variations include Raman-AFM/SNOM, Raman-SEM, inverted Raman microscopy, mobile research-grade Raman microspectroscopy, and systems featuring ParticleScout Raman-based microparticle analysis. To find out more

Oxford Instruments is hosting a workshop

Date	Time	Presenters	Presentation Title	Venue
Tues August 27	13:00-13:30 pm	Simon Burgess and Lucia Spasevski	How the new BEX technique is changing what we can analyse in the SEM	Theatre 5

With new technologies comes new capabilities. The new Backscattered Electron and X-ray (BEX) technique is revolutionising elemental analysis in the Scanning Electron Microscope (SEM). Its geometry, sensitivity and speed are pushing the boundaries of what’s possible with elemental analysis in SEM. During this session, you will see how Unity and BEX are solving challenging samples and applications, from analysing fracture surfaces (high topography) and detecting tiny concentration differences (segregation, diffusion at <1wt%) to multi-scale analysis of whole samples.

Key learning objectives:

Basics of the BEX technique and its advantages
How BEX is used to increase productivity in SEM
How BEX is used to solve real challenging applications

Other activities at EMC

Our team of experts play an active role in this event. As well as our workshop, we will be presenting papers and posters, all revealing something that's new in EM Analytics or materials characterization. You can see the full details of our participation in EMC 2024, below

Presentations

Session	Date	Time	Presenter	Title
IM-13 (2)	Tues August 27	14:00 - 16:00	Louise Hughes	A Better Insight Into Battery Materials Using A Correlative Approach

Posters

Paper number	Session	Date	Time	Presenter	Title
591	IM-05	Mon - Tues 26-27 August	16.00-18.30	Katherine MacArthur	Development and applications of backscattered electron and X-ray detector
428	IM-12	Mon - Tues 26-27 August	16.00-18.30	Louise Hughes	Backscattered electron and X-ray imaging for array tomography provides rapid specimen characterisation and ROI targeting
1120	IM-05	Mon - Tues 26-27 August	16.00-18.30	Louise Hughes	Multimodal imaging accelerates the analysis of composition in bone implant sites
455	IM-06	Wed - Thurs 28-29 August	16.00-18.30	Mark Coleman	Improving Transmission Kikuchi Diffraction workflows

Scientific Image

Paper number	Presenter	Title
1252	Louise Hughes	Backscattered electron and X-ray (BEX) image of pollution particles on a birch seed

Accelerating the breakthroughs that create a brighter future for our world

Meet us at EMC 2024!