CFAR Annual Forum 2026 - Oxford Instruments

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CFAR Annual Forum 2026

Sep

25

Meet Oxford Instruments at CFAR Annual Forum 2026

We are thrilled to announce that Oxford Instruments will be participating in the CFAR Annual Forum 2026!

Visit our booth and understand our solutions for semiconductor advanced inspection and metrology!

What Awaits You at Our Booth:

Cutting-Edge Innovations: Explore OI’s solutions for semiconductor applications, including failure analysis, inspection and process control, and integrated metrology equipment.
Expert Engagement: Meet our team of specialists ready to discuss tailored solutions that drive your success in semiconductor manufacturing.
Exclusive Networking Opportunities: Connect with peers and industry leaders to build relationships that inspire collaboration and growth.

Presenting at CFAR 2026:

We invite you to participate in our talk in the forum, where you can interact with our speakers and see how our solutions can enhance your daily work.

Title:

“Advanced Characterization Techniques for Semiconductor Failure Analysis using AFM and Raman Spectroscopy”

We can't wait to connect with you and help unlock new possibilities!

Location

The Palms Country Club by Filinvest, Alabang, Muntinlupa City, Metro Manila, Philippines

Date

25 September 2026

Book an Expert Meeting

Expert Meeting Request

Book a one-to-one meeting with our imaging specialists during iSEA 2026. Whether you are evaluating new technologies, expanding facility capabilities, or seeking application support, our team would be delighted to meet with you.

Preconference Workshop

Ting-Yu Wang

Senior Application Scientist

4 November 2025 | EBSD Session

We’re presenting at the EBSD session during the Preconference Workshop. Join us to learn more about the latest advances in Electron Backscatter Diffraction (EBSD) and its role in materials research and development.