The modern academic multi-user facility has a diverse range of analytical needs from Biological research, Materials R&D, Polymers, and Semiconductor. The Atomic Force Microscope is a multi functional instrument which can provide incredible value to all of these research areas.

This presentation by Oxford Instruments Asylum Research will discuss the basic physics of the atomic force microscope, and basic application areas including topographic imaging and roughness measurement. We will then discuss more advanced techniques such as nanoelectrical measurements (CAFM) with applications to Materials R&D and Semiconductor. Finally, we will discuss nanomechanical techniques (force curves and force mapping) with applications to Biological and Polymer research.

Learn more about the Cypher S AFM.