This virtual online seminar will provide an overview of basic data processing protocols to enhance user presentation capabilities for AFM image data collected on FSU’s Materials Characterization Lab Asylum Research AFM.

Processing steps like flattening, plane fitting & masking will be shown. Analysis procedures such as line sections, roughness reports, & histogram generation will also be demonstrated. A brief overview of the 3D & 4D rendering software will also be introduced.

Learn more about Asylum Research AFMs.

Your Speaker:

Ryan Fuierer

Oxford Instruments Asylum Research