Atomic Force Microscopy for in-situ Measurements in Liquid, Gaseous, and Temperature Controlled Environments
AFM for in-situ Measurements in Liquid, Gaseous, and Temperature Controlled Environments
The Atomic Force Microscope is an excellent tool for analysis of samples at the nanoscale in Liquid, Gaseous, and Temperature varying environments. This presentation will discuss the basic physics of the atomic force microscope, and basic application areas including topographic imaging and roughness measurement.
We will then discuss the use of blueDrive photothermal excitation for high speed, easy imaging in Liquid environments. Next we will explore the environmental control features of the Cypher ES AFM through a discussion of experiments in Temperature varying, electrochemical, and gaseous environments. Then, we will briefly discuss the nanomechanical modes available with applications to Polymer Research.