Online Seminar
Atomic Force Microscopy for in-situ Measurements in Liquid, Gaseous, and Temperature Controlled Environments
Oct
9
AFM for in-situ Measurements in Liquid, Gaseous, and Temperature Controlled Environments

The Atomic Force Microscope is an excellent tool for analysis of samples at the nanoscale in Liquid, Gaseous, and Temperature varying environments. This presentation will discuss the basic physics of the atomic force microscope, and basic application areas including topographic imaging and roughness measurement.

We will then discuss the use of blueDrive photothermal excitation for high speed, easy imaging in Liquid environments. Next we will explore the environmental control features of the Cypher ES AFM through a discussion of experiments in Temperature varying, electrochemical, and gaseous environments. Then, we will briefly discuss the nanomechanical modes available with applications to Polymer Research.

This seminar is hosted by Oxford Instruments Asylum Research in partnership with the Department of Materials Science and Engineering and the Center for Advanced Construction Materials at the University of Texas at Arlington.

Location

Online Seminar

Date

Friday, October 9, 2020

Time

1 - 2 PM (CDT)

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