Join us at the Advanced Material Show
The Advanced Materials Show provides a truly unique, free-to-attend exhibition and conference that brings together a highly focused audience, all involved in the research, production, purchasing or integration of advanced materials technology including Graphene & 2D Materials, Composites, Polymers, Coatings, and Ceramics.
Oxford Instruments will be there to present its latest product innovations. Stop by our stand 626 in hall 18 from 29th & 30th June 2022 and have a chat with our experts!
Oxford Instruments materials analysis solutions enable you to accurately analyse and characterise materials down to the nanoscale level more rapidly, by combining superior detection and analysis instruments with software platforms that interpret the resulting data in the context of your research.
Our innovative expertise and key-enabling technologies will empower you to accelerate your R&D or increase your productivity.
Featured Technologies include:
Browse the Conference Agenda
- NanoAnalysis tools enabling materials characterisation (including EDS, EBSD and WDS) and sample manipulation at the nanometre scale. Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of applications including coatings, semiconductors, renewable energy, mining, metallurgy, and forensics.
- NMR spectroscopy and time domain (TD-NMR) relaxometry. The X-Pulse NMR spectrometers and MQC+ analysers provide fast, simple and accurate measurements to deliver robust solutions for industries including batteries, construction materials, textiles, polymers, chemicals.
- Atomic Force Microscopy (AFM) for academic research and industrial R&D, enabling cutting-edge work in fields including, 2D materials, polymer science, semiconductors.
- Confocal Raman imaging microscopes for 2D and 3D chemical characterization. WITec Raman microscopes can also be integrated with AFM, SEM, SNOM or Raman-based particle analysis as correlative systems for investigating chemical and structural sample properties.