OI x Novatiq Scientific Singapore Joint Workshop
Exploring New Dimensions: Advancing Characterization with Next-Generation AFM & Confocal Raman Microscopy

We invite you to join us for a focused, application-driven workshop designed specifically for users working with advanced materials characterization.

This workshop will bring together active researchers from NUS and NTU alongside Oxford Instruments application specialists. Featuring 15-minute case-study presentations from user experts covering 2D materials, ferroelectrics, thin films, and memory devices, this workshop highlights practical workflows using Cypher AFM and WITec Raman systems. 

Reserve your spot to connect with peers and elevate your nanoscale characterization capabilities.

※Admission to this workshop is free but limited seats are available.

※Limited slots are available for sample evaluation. Successful applicants will be sent a confirmation email prior to the workshop. 

View the agenda and submit the registration form below.

OI Speakers

• Taesung Lee, AFM Application Scientist 
• Dr Guo Rui, Senior Applications Specialist (Raman)