Meet Oxford Instruments at the 245th ECS Meeting in San Francisco, California.

We are looking forward to participating at the 245th ECS Meeting. 

This international conference brings together scientists, engineers, and researchers from academia, industry, and government laboratories to share results and discuss issues on related topics through a variety of formats such as oral presentations, poster sessions, panel discussions, tutorial sessions, short courses, professional development workshops, and exhibits. The meeting’s unique blend of electrochemical and solid state science and technology provides an opportunity and forum to learn and exchange information on the latest scientific and technical developments in a variety of interdisciplinary areas.

Oxford Instruments will be there to present its latest product innovations. 

Oxford Instruments analysis solutions enable you to accurately analyse and characterise Battery materials down to the nanoscale level more rapidly, by combining superior detection and analysis instruments with software platforms that interpret the resulting data in the context of your research.

Our innovative expertise and key-enabling technologies will empower you to accelerate your R&D or increase your productivity.

Featured Technologies include:

• NanoAnalysis tools enabling materials characterisation (including EDS, BEX EBSD and WDS) and sample manipulation at the nanometre scale. Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D and QC across a wide range of applications including batteries, coatings and semiconductors.
• NMR spectroscopy and time domain (TD-NMR) relaxometry. The X-Pulse NMR spectrometers and MQC+ analysers provide fast, simple and accurate measurements to deliver robust solutions for industries including batteries, polymers and chemicals.
• Atomic Force Microscopy (AFM) for nanoimaging of battery components and interfaces and nanoimaging of electrochemical processes
  
• Confocal Raman imaging microscopes for 2D and 3D chemical characterization. WITec Raman microscopes can also be integrated with AFM, SEM, SNOM or Raman-based particle analysis as correlative systems for investigating chemical and structural sample properties.

Stop by our booth to meet our colleagues and discuss your current work and process challenges!