2025 MRS Fall Meeting & Exhibit - Oxford Instruments

Oxford Instruments will be showcasing our cutting-edge technologies. This includes our next-generation Atomic Force Microscopy (AFM), confocal Raman microscopy, electron microscopy detectors, and nanoindentation technology. We are proud to unveil exciting developments that are currently in the pipeline and offer live demonstrations of our latest innovations. Visit our booth to experience firsthand the advancements we are making in these fields.

iX05 Operando Nanoindenter
The iX05 is a high-performance operando nanoindenter engineered to measure local mechanical properties under real-world conditions—including high/low temperatures, high strain rates, and liquid environments. Unlike traditional systems limited to lab settings, the iX05 enables testing in environments that reflect actual material applications. Powered by FemtoTools’ MEMS-based technology and fast control electronics, it delivers unmatched resolution, speed, and environmental control for advanced materials research.

Learn more about Nanoindentation

Vero S is the standard ambient configuration of the next-generation Vero AFMs, which precisely and accurately measure true tip displacement using Quadrature Phase Differential Interferometry (QPDI).

Learn more about the Vero S

Ultim® Max ∞ SDD detectors unlock the infinite potential of EDS for characterizing materials in the SEM. They combine unparalleled accuracy, sensitivity and speed to power AZtec Live software to solve the most complex or difficult analysis challenges.

Learn more about Ultim Max Infinity

witec360 Raman Microscope

The Oxford Instruments witec360 is the new benchmark for Raman imaging and correlative microscopy systems, designed to meet the growing demands of academic and industrial researchers for comprehensive analysis at the nanoscale.

Learn more about the witec360

Join Oxford Instruments for a speaking session at the highly anticipated Material Research Society meeting. Dr. Miriam Boehmler, Head of Raman Applications, will discuss how confocal Raman spectroscopy and imaging enable real-time, in situ analysis of materials under extreme thermal conditions, showcasing applications in diamond coating optimization and refractory material development, and highlighting recent instrumental advancements that expand Raman’s impact on high-temperature material design.

Session: SF09.04 Materials at High Temperatures – Characterization and Testing

Title: In Situ Confocal Raman Spectroscopy and Imaging for High-Temperature Materials Characterization

Speaker: Dr. Miriam Boehmler, Head of Applications

When: 12/5, 11:15 – 11:30 am

Where: Hynes, Level 2, Room 209

Additionally, join us for the Oxford Instruments sponsored poster session covering the latest advances in understanding selective transport in nanomaterial-based pores, channels, and membranes.

Session: NM03 Selective Separations in Nanomaterials

When: 12/2, 7 – 9PM

Where: Hynes, Level 1, Hall A