In materials science, every detail matters. Oxford Instruments' comprehensive materials characterization portfolio empowers researchers and engineers to understand the properties that define durability, conductivity, strength, and sustainability. From microstructure characterization to elemental composition and failure analysis, our solutions deliver the clarity and confidence you need to understand your research better and innovate faster.
Discover our solutions in electron microscopy, nanoindentation, Raman microscopy, and atomic force microscopy that enable materials analysis across a diverse set of materials including ceramics, polymers, metals, advanced alloys, and 2D materials.
Have a question?Electron microscopy techniques like EDS, BEX, and EBSD facilitate core labs in identifying material composition, structural interfaces, and crystallographic orientation—enabling faster root cause analysis, deeper insight into failure mechanisms, and streamlined workflows for advanced research. Oxford Instruments’ offers a range of solutions that enable ease in SEM and TEM workflows.
Ion Polishers utilize Argon plasma to etch and prepare both flat and cross-sectional samples. This provides a complementary sample preparation technique that unlocks a new level of analysis for challenging materials.
Nanomanipulators are a tool integrated in the electron microscopy system that allows for positioning, probing, cutting, and lift-out —while observing them in real time under high magnification.
EDS is an analytical technique used to identify and quantify the elemental composition of materials by measuring characteristic X-rays emitted from a sample.
BEX or Backscattered Electron and X-ray is a pioneering analytical technique for SEM that combines Backscattered Electron and X-ray imaging in a single technique, simultaneously. It provides more information about sample composition and elemental distribution in the same acquisition time, with the same operating conditions.
EBSD analyzes the diffraction patterns of backscattered electrons to determine crystal structure, grain orientation, and phase—critical for understanding mechanical stress, failure modes, and microstructural behavior.
In-situ nanoindentation is a technique for measuring nanoscale mechanical properties while visualizing material deformation in real time within the SEM.
Analytics are the integrated software solutions that enable researchers to solve to identify composition and analyze complex materials within the electron microscope. Oxford Instruments offers the AZtec platform including dedicated work flows to make your analysis faster, easier, and more accurate.
RISE, Raman-SEM, is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.
Precise mechanical characterization is essential for understanding material performance.
Nanoindentation enables labs to measure hardness, modulus, and other properties at the nanoscale—providing reliable, repeatable data that supports advanced research, quality control, and materials development across a wide range of applications.
Operando nanoindentation is designed to measure local mechanical properties in real-world conditions, such as high temperatures, low temperatures, high strain rates, or in liquid environments, allowing for material analysis in practical applications.
App Note: Tracking Phase-level Properties with Heat Treatments Using Mechanical Microscopy App Note: Metal Fingerprints – Anisotrophy of Titanium via Correlative Mechanical Microscopy App Note: Adhesion Measurement via Nanoindentation
Raman spectroscopy is a vibrational technique that provides a spectral fingerprint, distinguishing compounds by their chemical structure. It provides non-destructive chemical and molecular characterization, enabling core labs to maximize sample use. The newly launched witec 360 Raman microscope combines advanced optics with flexible, intuitive workflows—supporting diverse applications while adapting to evolving research needs and user turnover.
App Note: Confocal Raman Imaging and Correlative Techniques in Life Science App Note: Nano-Carbon & 2D MaterialsAFM is a key imaging tool for nanoscale analysis of sample morphology and material properties, widely used in 2D materials, micro/nanofabrication, chemistry, energy, and life sciences.
The Jupiter Discovery AFM is designed for core facilities, which serve users from many different research fields and with varying levels of AFM experience, with solutions like pre-mounted probes and guided workflows
Video: Jupiter Discovery Time to Results Video: Demonstrating FFM-Topography with AutoPilot Webpage: AFM for Core Facilities
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