Measurement of Polymer and Polymer Phase Properties

Related to: Polymers

The atomic force microscope (AFM) is a powerful tool for characterizing polymer materials. It provides nanoscale information on a wide range of physical properties and behaviour in addition to imaging morphology. Whether investigating fundamental principles of polymer science or engineering a specific polymer solution (Figure 2), the AFM is a key instrument for evaluating polymers at small length scalesIts spatial resolution enables visualisation of sub-micrometer and sub-nanometer polymer morphology. But AFMs can contribute much more information about polymers besides simple topographic morphology, including probing molecular-level forces, mapping mechanical, thermal, and electrical properties and assessing solvent and thermal effects in near real time.

AFM for Polymer Science

Measurement of Polymer and Polymer Phase Properties figure 1

Image: Elastic modulus map of a polystyrene (PS)-polycaprolactone (PCL) blend imaged with Fast Force Mapping Mode on the MFP-3D Infinity AFM

AFM for Polymer Science AFM for Nanomechanical Measurements Measuring Oil in Crystal Polystyrene Measuring Plasticiser Content in PVC Measuring Polybutadiene in Impact Polystyrene Measurement of Xylene Solubles in Polypropylene Simple, Rapid Determination of the Percentage of Polyoxyethylene (POE) in Poloxamers