Ultimate spatial resolution and low energy performance for EDS in the SEM. Combining Extreme electronics and windowless construction with optimised geometry and sensor design delivers…

The FlexAL systems provide a new range of flexibility and capability in the engineering of nanoscale structures and devices by offering remote plasma atomic layer deposition (ALD)…

Maximised large area etching and deposition production solutions

The Asylum Research MFP-3D-BIO sets the standard for integrating AFM and optical microscopy for bioscience research. It is the only bio-AFM that makes no compromises…

LayerProbe is an exciting software tool for thin film analysis in the SEM. An option for the AZtec EDS microanalysis system, LayerProbe is faster, more cost-effective and higher…

Our flagship SDD detector for TEM, the X-Max^N 100TLE provides the perfect solution for field emission and aberration corrected TEMs working at the frontiers of nanoscience.

The X-Max^N range of SDD for TEM exploits a new sensor chip, new electronics, and innovative packaging to deliver a truly ‘next generation’ SDD performance.

AZtecTEM is an innovative EDS software specifically optimised for advanced TEM applications.

AZtecTEM is a unique system approach to the characterisation of materials at…

A ninth generation of nanomanipulator, the OmniProbe 400 exploits innovative piezo actuation for best in class nanoscale positioning. Optimised for maximum flexibility and performance,…

The X-Max^N Silicon Drift Detector large area sensor chips, digital signal processing, and innovative packaging deliver the highest sensitivity for accurate analysis of…

The PlasmaPro 100 Estrelas platform is designed to give total flexibility for Deep Silicon Etch (DSiE) applications - serving a diverse set of process requirements across the Micro…

INCAEnergy+ combines WDS and EDS to deliver the power of WDS sensitivity and resolution with EDS productivity and ease of use.

Wavelength Dispersive Spectroscopy (WDS) software,…

The PlasmaPro 80 reactive ion etch (RIE) is a compact, small footprint system offering versatile etch and deposition solutions with convenient open loading. It is easy to site and…

The industry-leading PORT MOUNTED nanomanipulators for FIB and SEM instruments include this model integrating 100nm closed-loop encoder feedback control for accuracy, flexibility…

This windowless silicon drift detector sensor for TEM applications provides a collection solid angle in the range 0.3 to 0.7 steradians*. Its superb collection efficiency over the…