Introduction to Energy Dispersive Spectrometry (EDS) inside the Transmission Electron Microscope (TEM)

A technique that has yet to be widely adopted across the microscopy community, we feel that STEM-SEM provides a strong alternative to traditional TEM and STEM. It has shown to be extremely effective when analysing features with sizes between 3 and 100 nm, whilst requiring significantly less column alignment and faster turn around when imaging a range of samples.

In this tutorial, discover the fundamentals of Energy Dispersive Spectrometry (EDS) analysis within a Transmission Electron Microscope (TEM), exploring the differences between a TEM and scanning electron microscopy.